Purpose - The purpose of this paper is to introduce a method which allows the calculation of the interactions of tip and sample of a magnetic force microscope as a first step to increase the accuracy of this technique. Design/methodology/approach - The emerging magnetic interactions between the cantilever tip and an arbitrary magnetized sample can be evaluated by the use of several numerical methods. For modelling this magnetically and mechanically coupled multiscale problem the finite element method is implemented. Findings - The evaluated magnetic fields interact in such a manner that a constructive overlap at the tip apex occurs. This leads to attractive forces acting on the cantilever. Research limitations/implications - In order to inc...
Magnetic force microscopy (MFM) is a variant of atomic force microscopy (AFM), in which a probe with...
A method has been developed in this work for the mechanical manipulation of magnetic nanoparticles (...
Purpose: The purpose of this paper is to investigate the accuracy of different force calculation met...
This paper presents an analytical approach to magnetic force microscopy (MFM). Some features of a re...
Abstract. In this chapter Magnetic Force Microscopy is treated in detail. The emphasis is on high re...
We investigate the domain structure of submicrometer sized ferromagnetic stripes exhibiting in-plane...
Two approaches to the interpretation of the data of magnetic force microscopy are considered. The fi...
Presented here is a summary of the improvements made to a standard magnetic force microscope for the...
Resumen del trabajo presentado en la 11th International Conference on Nanomaterials: Applications an...
A magnetically coated tip is a fundamental part of the MFM instrument. These tips’ are bought commer...
[[abstract]]磁力探針顯微術是研究奈米鑄型磁性薄膜的重要工具,它可以幫助我們了解微觀的磁區結構,更有助於解讀宏觀磁特性的量測結果,進而探究其物理意涵及發展更多的應用。在本文中,我們將介紹磁力...
This article uses a fully quantitative approach to describe the behavior of the minute tip of the ma...
Magnetic force microscopy (MFM) refers to a family of scanning probe techniques based on atomic for...
Magnetic force microscopy (MFM) is a widely-used technique for measuring the local magnetic properti...
Magnetic force microscopy has unsurpassed capabilities in analysis of nanoscale and microscale magne...
Magnetic force microscopy (MFM) is a variant of atomic force microscopy (AFM), in which a probe with...
A method has been developed in this work for the mechanical manipulation of magnetic nanoparticles (...
Purpose: The purpose of this paper is to investigate the accuracy of different force calculation met...
This paper presents an analytical approach to magnetic force microscopy (MFM). Some features of a re...
Abstract. In this chapter Magnetic Force Microscopy is treated in detail. The emphasis is on high re...
We investigate the domain structure of submicrometer sized ferromagnetic stripes exhibiting in-plane...
Two approaches to the interpretation of the data of magnetic force microscopy are considered. The fi...
Presented here is a summary of the improvements made to a standard magnetic force microscope for the...
Resumen del trabajo presentado en la 11th International Conference on Nanomaterials: Applications an...
A magnetically coated tip is a fundamental part of the MFM instrument. These tips’ are bought commer...
[[abstract]]磁力探針顯微術是研究奈米鑄型磁性薄膜的重要工具,它可以幫助我們了解微觀的磁區結構,更有助於解讀宏觀磁特性的量測結果,進而探究其物理意涵及發展更多的應用。在本文中,我們將介紹磁力...
This article uses a fully quantitative approach to describe the behavior of the minute tip of the ma...
Magnetic force microscopy (MFM) refers to a family of scanning probe techniques based on atomic for...
Magnetic force microscopy (MFM) is a widely-used technique for measuring the local magnetic properti...
Magnetic force microscopy has unsurpassed capabilities in analysis of nanoscale and microscale magne...
Magnetic force microscopy (MFM) is a variant of atomic force microscopy (AFM), in which a probe with...
A method has been developed in this work for the mechanical manipulation of magnetic nanoparticles (...
Purpose: The purpose of this paper is to investigate the accuracy of different force calculation met...