Distribution of read lengths and sequence errors.

<p>(<b>A</b>) Kernel density plot of read lengths obtained by extended-length ion semiconductor sequencing. Each line represent results from an independent library, black line indicates library containing controls for error rate calculations and sensitivity studies. Vertical line marks the cutoff for full-length sequences. (<b>B</b>) Error rates for unprocessed and de-noised sequence reads, stratified by error type and reference organism. (<b>C</b>) Cumulative proportion of unprocessed and de-noised sequence reads at defined error counts. For unprocessed reads the fraction of sequences represented at a particular error count reflects the number of reads, and for de-noised sequences it reflects the total number of reads contributing to clusters.