Controlled Growth of Zn-polar Zn0 Epitaxial Film by Nitridation of Sapphire Substrate
- Mei, Z. X.
- Du, X. L.
- Wang, Y.
- Ying, M. J.
- Zeng, Z. Q.
- Zheng, H.
- Jia, J. F.
- Zhang, Z.
- Xue, Q. K.
Publication date
March 2005
DOI Publisher
AIP Publishing ISSN
0003-6951 Citation count (estimate)
41Abstract
Surface nitridation is used to eliminate O-polar inversion domains and control the growth of single-domain Zn-polar ZnO film on sapphire (0001) substrate by rf-plasma-assisted molecular-beam epitaxy. It is found that the nitridation temperature is crucial for achieving quality AlN buffer layers and ZnO films with cation polarity, as demonstrated by ex situ transmission electron microscopy. Under optimal growth conditions, a 4×4 surface reconstruction was observed, which is confirmed to be a characteristic surface structure of the Zn-polar films, and can be used as a fingerprint to optimize the ZnO growth
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