Means ± SED (M), broad-sense heritability (H) and P values for grain yield, days to flowering, and plant height and percentage yield reduction (YR) of trial mean grain yield under stress and non-stress conditions.
- Shalabh Dixit (411173)
- B. Emma Huang (644214)
- Ma. Teresa Sta Cruz (644216)
- Paul T. Maturan (644217)
- Jhon Christian E. Ontoy (644218)
- Arvind Kumar (227201)
Publication date
October 2014
DOIAbstract
a<p>P1 = Moroberekan, P2 = Swarna, M = population mean, H = heritability, **** = significant at 0.01% <i>P</i> level.</p><p>Means ± SED (M), broad-sense heritability (H) and P values for grain yield, days to flowering, and plant height and percentage yield reduction (YR) of trial mean grain yield under stress and non-stress conditions.</p
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