Analogue fault simulation is needed to evaluate the quality of tests, but is very computationally intensive. Behavioural simulation is more abstract and thus faster than fault simulation. Using a phase-locked loop as a case study, we show how behavioural fault models can be derived from transistor-level fault simulations and that faulty behaviour can be accurately modeled
International audienceThe probability of transient faults increases with the evolution of technologi...
Recent work has shown that the use of switched current methods can provide an effective route to imp...
© 2017 IEEE. Fault simulation is very important task for testing and fault diagnostics based on the ...
Two of techniques to speed-up analogue fault simulation are: fault dropping/collapsing, in which fau...
Abstract — With the growing density of Very Large Scale Integrated(VLSI) circuits, traditional digit...
One of the main requirements for generating test patterns for analog and mixed-signal circuits is fa...
A novel method for analogue high-level fault simulation (HLFS) using linear and non-linear high-leve...
High level modelling (HLM) for operational amplifiers (op amps) has been previously carried out suc...
Analog circuits are usually tested by checking if their specifications are satisfied. This methodolo...
For high quality VLSI products, exhibiting very low escape rates, defect-oriented testing becomes ma...
Fault simulation is an essential tool for developing test patterns for circuits. Because the potenti...
In this paper the extensions of our analogue fault simulator `aFSIM' to a multi-level hierarchical a...
The purpose of this research is to develop effective simulation methods for electrically oriented fa...
The domain of fault simulation for digital circuits de-scribed at the RT-level is currently under he...
INTERNATIONAL STANDARD SERIAL NUMBERS (Translation and Original): 0923-8174The probability of transi...
International audienceThe probability of transient faults increases with the evolution of technologi...
Recent work has shown that the use of switched current methods can provide an effective route to imp...
© 2017 IEEE. Fault simulation is very important task for testing and fault diagnostics based on the ...
Two of techniques to speed-up analogue fault simulation are: fault dropping/collapsing, in which fau...
Abstract — With the growing density of Very Large Scale Integrated(VLSI) circuits, traditional digit...
One of the main requirements for generating test patterns for analog and mixed-signal circuits is fa...
A novel method for analogue high-level fault simulation (HLFS) using linear and non-linear high-leve...
High level modelling (HLM) for operational amplifiers (op amps) has been previously carried out suc...
Analog circuits are usually tested by checking if their specifications are satisfied. This methodolo...
For high quality VLSI products, exhibiting very low escape rates, defect-oriented testing becomes ma...
Fault simulation is an essential tool for developing test patterns for circuits. Because the potenti...
In this paper the extensions of our analogue fault simulator `aFSIM' to a multi-level hierarchical a...
The purpose of this research is to develop effective simulation methods for electrically oriented fa...
The domain of fault simulation for digital circuits de-scribed at the RT-level is currently under he...
INTERNATIONAL STANDARD SERIAL NUMBERS (Translation and Original): 0923-8174The probability of transi...
International audienceThe probability of transient faults increases with the evolution of technologi...
Recent work has shown that the use of switched current methods can provide an effective route to imp...
© 2017 IEEE. Fault simulation is very important task for testing and fault diagnostics based on the ...