Electrode–electrode gap distance (GD) of Ag electrodes was measured by using scanning tunneling microscope breaking junction (STM-BJ) technique. An oxygen atom can be expected to bridge the Ag electrodes in series as Ag–O–Ag during the thinning of Ag point contacts under elongation. The GD with the oxygen junction is smaller by about 1.5 to 2 Å than the GD without the oxygen junction as soon as the Ag contact ruptures. This result is attributed to the Ag–O atomic junction formation, which is enhanced due to oxygen insertion in Ag electrodes. Furthermore, we successfully observed the longer molecular plateau length for the small GD when compared with the large GD, where a series of amine-terminated oligophenyl and alkane molecules were forme...
The reproducible fabrication of nanoscale gaps below 5 nm between metallic electrodes is key to the ...
The following article appeared in Applied Physics Letters vol 99,12 (2011): 123105 and may be found...
The following article appeared in Applied Physics Letters vol 99,12 (2011): 123105 and may be found...
ABSTRACT. We use a scanning tunneling microscope based break-junction technique to measure the condu...
The temperature dependence of the conductance and plateau length for the single-molecule junctions f...
We compare the conductance of a series of amine-terminated oligophenyl and alkane molecular junction...
We compare the conductance of a series of amine-terminated oligophenyl and alkane molecular junction...
A straightforward method to generate both atomic‐scale sharp and atomic‐scale planar electrodes is r...
In this work, an electrochemical method of fabricating and modifying nanogap electrodes on a silicon...
The reproducible fabrication of nanoscale gaps below 5 nm between metallic electrodes is key to the ...
International audienceThis study focuses on comparing methods for capturing and measuring the charge...
We use a modified conducting atomic force microscope to simultaneously probe the conductance of a si...
In this work, an electrochemical method of fabricating and modifying nanogap electrodes on a silicon...
There is the hope that Molecular electronics would enable the fabrication of ultra-small sized funct...
International audienceThis study focuses on comparing methods for capturing and measuring the charge...
The reproducible fabrication of nanoscale gaps below 5 nm between metallic electrodes is key to the ...
The following article appeared in Applied Physics Letters vol 99,12 (2011): 123105 and may be found...
The following article appeared in Applied Physics Letters vol 99,12 (2011): 123105 and may be found...
ABSTRACT. We use a scanning tunneling microscope based break-junction technique to measure the condu...
The temperature dependence of the conductance and plateau length for the single-molecule junctions f...
We compare the conductance of a series of amine-terminated oligophenyl and alkane molecular junction...
We compare the conductance of a series of amine-terminated oligophenyl and alkane molecular junction...
A straightforward method to generate both atomic‐scale sharp and atomic‐scale planar electrodes is r...
In this work, an electrochemical method of fabricating and modifying nanogap electrodes on a silicon...
The reproducible fabrication of nanoscale gaps below 5 nm between metallic electrodes is key to the ...
International audienceThis study focuses on comparing methods for capturing and measuring the charge...
We use a modified conducting atomic force microscope to simultaneously probe the conductance of a si...
In this work, an electrochemical method of fabricating and modifying nanogap electrodes on a silicon...
There is the hope that Molecular electronics would enable the fabrication of ultra-small sized funct...
International audienceThis study focuses on comparing methods for capturing and measuring the charge...
The reproducible fabrication of nanoscale gaps below 5 nm between metallic electrodes is key to the ...
The following article appeared in Applied Physics Letters vol 99,12 (2011): 123105 and may be found...
The following article appeared in Applied Physics Letters vol 99,12 (2011): 123105 and may be found...