Add to ORKGThis paper presents a new BIST reseeding method that can significantly increase the ratio of test data compression using one LFSR seed to encode multiple deterministic test patterns. Experimental results on ISCAS89 benchmark circuits show that this method has about 30% reduction of the seed numbe
An approach for input data compaction in the testing of circuits using scan and partial scan has rec...
A comparative analysis of the encoding efficiency of built-in-self-test (BIST) schemes based on rese...
In recent years, with the advance of digital Very Large Scale Integrated (VLSI) circuits, manufactur...
This paper presents a new BIST reseeding method that can significantly increase the ratio of test da...
Linear feedback shift register (LFSR) reseeding is an effective method for test data reduction. Howe...
Abstract—This paper presents a new low-power test-data-compression scheme based on linear feedback s...
In this paper we describe a method to combine dictionary coding and partial LFSR reseeding to improv...
In this paper a novel reseeding architecture for scan-based BIST, which uses an LFSR as TPG, is prop...
In testing there are two primary domains one is reducing input test data volume and next is reducing...
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce aver...
This paper considers the problem of minimizing the power required to test a BIST based combinational...
... reseeding architecture is the limited seed efficiency due to the variance in the number of speci...
textAs the size and complexity of systems-on-a-chips (SOCs) continue to grow, test data volume and ...
textAs the size and complexity of systems-on-a-chips (SOCs) continue to grow, test data volume and ...
Mixed-mode BIST offers complete fault coverage with short test application times and small test data...
An approach for input data compaction in the testing of circuits using scan and partial scan has rec...
A comparative analysis of the encoding efficiency of built-in-self-test (BIST) schemes based on rese...
In recent years, with the advance of digital Very Large Scale Integrated (VLSI) circuits, manufactur...
This paper presents a new BIST reseeding method that can significantly increase the ratio of test da...
Linear feedback shift register (LFSR) reseeding is an effective method for test data reduction. Howe...
Abstract—This paper presents a new low-power test-data-compression scheme based on linear feedback s...
In this paper we describe a method to combine dictionary coding and partial LFSR reseeding to improv...
In this paper a novel reseeding architecture for scan-based BIST, which uses an LFSR as TPG, is prop...
In testing there are two primary domains one is reducing input test data volume and next is reducing...
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce aver...
This paper considers the problem of minimizing the power required to test a BIST based combinational...
... reseeding architecture is the limited seed efficiency due to the variance in the number of speci...
textAs the size and complexity of systems-on-a-chips (SOCs) continue to grow, test data volume and ...
textAs the size and complexity of systems-on-a-chips (SOCs) continue to grow, test data volume and ...
Mixed-mode BIST offers complete fault coverage with short test application times and small test data...
An approach for input data compaction in the testing of circuits using scan and partial scan has rec...
A comparative analysis of the encoding efficiency of built-in-self-test (BIST) schemes based on rese...
In recent years, with the advance of digital Very Large Scale Integrated (VLSI) circuits, manufactur...