Effects of clonal patch area of <i>Leymus chinensis</i> on the slopes and intercepts of reproductive allometric relationships at two levels.

<p>Note: Using regression SMA analyses, allometric slopes and intercepts were obtained from the log–log linear relationship described as log₁₀Y = Slope×log₁₀X+Intercept. R² values indicate the extent to which the results can be explained by the models. “<i>-</i>” suggests that at <i>P</i> = 0.05 the relationship is not significant. Bold allometric slopes represent that they are significantly different from 1 at <i>P</i> = 0.05. Values in the same row sharing the same letter(s) are not significantly different at <i>P</i> = 0.05.</p><p>Effects of clonal patch area of <i>Leymus chinensis</i> on the slopes and intercepts of reproductive allometric relationships at two levels.