The paper presents an analysis of the statistical efficiency of the sinewave histogram test used for estimating the unknown transition levels of an analog-to-digital converter. Accordingly, at first a closed–form determination of the Cram´er–Rao bound is derived under the assumption of a noiseless stimulus signal. Both unbiased and biased versions of the bound are described in order to account for the eventual bias introduced by commonly employed estimators. Then, additive Gaussian noise is assumed and comments are made about its effects on the maximum achievable accuracy
The system described in this thesis was developed as part of a larger effort to design a high-perfor...
Cataloged from PDF version of article.In this paper, we investigate level-crossing (LC) analog-to-di...
ISBN : 978-1-4673-5542-1International audienceReduced code testing of a pipeline analog-to-digital c...
The paper presents an analysis of the statistical efficiency of the sinewave histogram test used for...
This paper deals with the effectiveness of the Sinewave Histogram Test (SHT) for testing analog to D...
Abstract – The sinewave histogram test is a commonly used method to characterize nonlinear behavior...
Abstract – This paper deals with an innovative strategy to shorten the record size required to estim...
The classical formula for the signal-to-noise ratio (SNR) of an analog-to-digital converter (ADC), S...
Prohibitive test time, nonuniformity of excitation, and signal nonlinearity are major concerns assoc...
Call number: LD2668 .R4 EECE 1989 S54Master of ScienceElectrical and Computer Engineerin
This work presents a new method to estimate the nonlinearity characteristics of analog-to-digital co...
In this brief, we demonstrate the procedures of linear model-based testing for the example of a 12-b...
Analog-to-digital converter (ADC) is the main workhorse in a digital waveform recorder. Strictly spe...
Abstract—Linearity testing of analog-to-digital converters (ADCs) can be very challenging because it...
Abstract. Improvements in technology, increasing in resolution and various correction techniques of ...
The system described in this thesis was developed as part of a larger effort to design a high-perfor...
Cataloged from PDF version of article.In this paper, we investigate level-crossing (LC) analog-to-di...
ISBN : 978-1-4673-5542-1International audienceReduced code testing of a pipeline analog-to-digital c...
The paper presents an analysis of the statistical efficiency of the sinewave histogram test used for...
This paper deals with the effectiveness of the Sinewave Histogram Test (SHT) for testing analog to D...
Abstract – The sinewave histogram test is a commonly used method to characterize nonlinear behavior...
Abstract – This paper deals with an innovative strategy to shorten the record size required to estim...
The classical formula for the signal-to-noise ratio (SNR) of an analog-to-digital converter (ADC), S...
Prohibitive test time, nonuniformity of excitation, and signal nonlinearity are major concerns assoc...
Call number: LD2668 .R4 EECE 1989 S54Master of ScienceElectrical and Computer Engineerin
This work presents a new method to estimate the nonlinearity characteristics of analog-to-digital co...
In this brief, we demonstrate the procedures of linear model-based testing for the example of a 12-b...
Analog-to-digital converter (ADC) is the main workhorse in a digital waveform recorder. Strictly spe...
Abstract—Linearity testing of analog-to-digital converters (ADCs) can be very challenging because it...
Abstract. Improvements in technology, increasing in resolution and various correction techniques of ...
The system described in this thesis was developed as part of a larger effort to design a high-perfor...
Cataloged from PDF version of article.In this paper, we investigate level-crossing (LC) analog-to-di...
ISBN : 978-1-4673-5542-1International audienceReduced code testing of a pipeline analog-to-digital c...