This Letter presents the first observation of coincidental emission of photons, electrons, and secondary ions from individual C<sub>60</sub> keV impacts. An increase in photon, electron, and secondary ion yields is observed as a function of C<sub>60</sub> projectile energy. The effect of target structure/composition on photon and electron emissions at the nanometer level is shown for a CsI target. The time-resolved photon emission may be characterized by a fast component emission in the UV−Vis range with a short decay time, while the electron and secondary ion emission follow a Poisson distribution
The emission yields of H, H-2, H-3 and heavy ions from carbon nanotubes under bombardments of Si and...
The yield of C60+ ions reflected from the surface of graphite is found to be a bimodal function of t...
This paper describes the advantages of using single impacts of large cluster projectiles (e.g., C60 ...
This Letter presents the first observation of coincidental emission of photons, electrons, and secon...
We report on the co-emission of secondary ions and electrons resulting from 15 keV C60+ and 30 keV C...
A sample for studying secondary ion emissions was made by pressing powders of carbon nanottibes with...
Besides fundamental interest in the study of ion-molecule collision aspects, the investigation of bi...
The total secondary electron emission (SEE) yield from the entrance and exit surfaces of thin carbon...
The spatial distributions and correlation of stochastic energy deposition events produced in macromo...
Carbon cluster emission from thin carbon foils (5-40 nm) impacted by individual Aun+q cluster projec...
Carbon cluster emission from thin carbon foils (5-40 nm) impacted by individual Aun+q cluster projec...
Carbon cluster emission from thin carbon foils (5-40 nm) impacted by individual Aun+q cluster projec...
Secondary ion mass spectrometry (SIMS) performed in the event-by-event bombardment detection mode wh...
The emission statistics of secondary electrons emitted from solid targets under ion impact has been ...
Energetic C60 ion impacts in the sub-MeV to MeV energy range, which can provide secondary ions (SIs)...
The emission yields of H, H-2, H-3 and heavy ions from carbon nanotubes under bombardments of Si and...
The yield of C60+ ions reflected from the surface of graphite is found to be a bimodal function of t...
This paper describes the advantages of using single impacts of large cluster projectiles (e.g., C60 ...
This Letter presents the first observation of coincidental emission of photons, electrons, and secon...
We report on the co-emission of secondary ions and electrons resulting from 15 keV C60+ and 30 keV C...
A sample for studying secondary ion emissions was made by pressing powders of carbon nanottibes with...
Besides fundamental interest in the study of ion-molecule collision aspects, the investigation of bi...
The total secondary electron emission (SEE) yield from the entrance and exit surfaces of thin carbon...
The spatial distributions and correlation of stochastic energy deposition events produced in macromo...
Carbon cluster emission from thin carbon foils (5-40 nm) impacted by individual Aun+q cluster projec...
Carbon cluster emission from thin carbon foils (5-40 nm) impacted by individual Aun+q cluster projec...
Carbon cluster emission from thin carbon foils (5-40 nm) impacted by individual Aun+q cluster projec...
Secondary ion mass spectrometry (SIMS) performed in the event-by-event bombardment detection mode wh...
The emission statistics of secondary electrons emitted from solid targets under ion impact has been ...
Energetic C60 ion impacts in the sub-MeV to MeV energy range, which can provide secondary ions (SIs)...
The emission yields of H, H-2, H-3 and heavy ions from carbon nanotubes under bombardments of Si and...
The yield of C60+ ions reflected from the surface of graphite is found to be a bimodal function of t...
This paper describes the advantages of using single impacts of large cluster projectiles (e.g., C60 ...