Focused ion beams (FIBs) are versatile tools with cross-disciplinary applications from the physical and life sciences to archeology. Nevertheless, the nanoscale patterning precision of FIBs is often accompanied by defect formation and sample deformation. In this study, the fundamental mechanisms governing the large-scale plastic deformation of nanostructures undergoing FIB processes are revealed by a series of molecular dynamic simulations. A surprisingly simple linear correlation between atomic volume removed from the film bulk and film deflection angle, regardless of incident ion energy and current, is revealed, demonstrating that the mass transport to the surface of material caused by energetic ion bombardment is the primary cause leadin...
Focused ion beam (FIB) processing is a widely used microscopic material removal method with precise ...
This study presents a detailed examination of the lattice distortions introduced by glancing inciden...
Focused ion beam (FIB) processing is a widely used microscopic material removal method with precise ...
Focused ion beams (FIBs) are versatile tools with cross-disciplinary applications from the physical ...
Focused ion beams (FIBs) are versatile tools with cross-disciplinary applications from the physical ...
Focused ion beams (FIBs) are versatile tools with cross-disciplinary applications from the physical ...
Focussed Ion Beam (FIB) milling is a mainstay of nano-scale machining. By manipulating a tightly foc...
Focused ion beam (FIB) is widely used as a material removal tool for applications ranging from elect...
Focussed Ion Beam (FIB) milling is a mainstay of nano-scale machining. By manipulating a tightly foc...
We have applied a novel approach to the investigation of deformation of nanoporous metals at the nan...
We have applied a novel approach to the investigation of deformation of nanoporous metals at the nan...
We have applied a novel approach to the investigation of deformation of nanoporous metals at the nan...
We have applied a novel approach to the investigation of deformation of nanoporous metals at the nan...
The ability to prepare ordered arrays of micro/nano sized magnetic elements offers the chance to inv...
The ability to prepare ordered arrays of micro/nano sized magnetic elements offers the chance to inv...
Focused ion beam (FIB) processing is a widely used microscopic material removal method with precise ...
This study presents a detailed examination of the lattice distortions introduced by glancing inciden...
Focused ion beam (FIB) processing is a widely used microscopic material removal method with precise ...
Focused ion beams (FIBs) are versatile tools with cross-disciplinary applications from the physical ...
Focused ion beams (FIBs) are versatile tools with cross-disciplinary applications from the physical ...
Focused ion beams (FIBs) are versatile tools with cross-disciplinary applications from the physical ...
Focussed Ion Beam (FIB) milling is a mainstay of nano-scale machining. By manipulating a tightly foc...
Focused ion beam (FIB) is widely used as a material removal tool for applications ranging from elect...
Focussed Ion Beam (FIB) milling is a mainstay of nano-scale machining. By manipulating a tightly foc...
We have applied a novel approach to the investigation of deformation of nanoporous metals at the nan...
We have applied a novel approach to the investigation of deformation of nanoporous metals at the nan...
We have applied a novel approach to the investigation of deformation of nanoporous metals at the nan...
We have applied a novel approach to the investigation of deformation of nanoporous metals at the nan...
The ability to prepare ordered arrays of micro/nano sized magnetic elements offers the chance to inv...
The ability to prepare ordered arrays of micro/nano sized magnetic elements offers the chance to inv...
Focused ion beam (FIB) processing is a widely used microscopic material removal method with precise ...
This study presents a detailed examination of the lattice distortions introduced by glancing inciden...
Focused ion beam (FIB) processing is a widely used microscopic material removal method with precise ...