RF characteristics of a nanoscale MOSFET are measured and analyzed at temperatures ranging from 4.2 to 300 K for deep-space RF applications. This device shows a 197-GHz current gain cutoff frequency (f(T)) and-a 162-GHz maximum oscillation frequency (f(max)) when operating at liquid-helium temperature, which represent a 60% and 80% improvement compared to room temperature performances, respectively. f(T) continually improves as the temperature decreases to near-liquid.-helium temperature due to the decrease of gate capacitance (C-gg). f(max) decreases as the. temperature is lowered below 25 K due to the increase of gate resistance (R-g).X111817sciescopu
International audienceIn this review paper, the performance characteristics of Gate-All-Around (GAA)...
We have assessed the use of commercial silicon-on-sapphire CMOS electronics in control circuits, whi...
The electrical properties of sub-0.1 µm gate length LDD devices are investigated between room and li...
In this paper, the high-frequency properties of MOSFETs at low-temperature operation are investigate...
This paper presents experimental RF characterizations and modeling on the nano-scale multi-finger ga...
This work presents a detailed RF characterization of 28-nm FD-SOI nMOSFETs at cryogenic temperatures...
This work presents detailed RF characterization of 28 nm FDSOI nMOSFETs at cryogenic temperatures do...
This work presents a detailed RF characterization of 28 FDSOI nMOSFETs at cryogenic temperatures dow...
This paper presents a new approach to optimize the RF performance at high temperatures for low power...
This work presents, for the first time to our best knowledge, RF characterization of 28 nm FDSOI CMO...
DC and RF characteristics of n-type FinFET transistor over a wide temperature range, from 77 to 473K...
ABSTRACT The existing compact models can reproduce the characteristics of MOSFETs in the temperature...
DoctorWith scaling-down of CMOS technology, problems such as an exponential increase of gate leakage...
Abstract: The electrical properties of sub-0.1 pm gate length LDD devices are investigated between r...
[[abstract]]In this paper, we demonstrate analyses of the effects of temperature (from -50degreesC t...
International audienceIn this review paper, the performance characteristics of Gate-All-Around (GAA)...
We have assessed the use of commercial silicon-on-sapphire CMOS electronics in control circuits, whi...
The electrical properties of sub-0.1 µm gate length LDD devices are investigated between room and li...
In this paper, the high-frequency properties of MOSFETs at low-temperature operation are investigate...
This paper presents experimental RF characterizations and modeling on the nano-scale multi-finger ga...
This work presents a detailed RF characterization of 28-nm FD-SOI nMOSFETs at cryogenic temperatures...
This work presents detailed RF characterization of 28 nm FDSOI nMOSFETs at cryogenic temperatures do...
This work presents a detailed RF characterization of 28 FDSOI nMOSFETs at cryogenic temperatures dow...
This paper presents a new approach to optimize the RF performance at high temperatures for low power...
This work presents, for the first time to our best knowledge, RF characterization of 28 nm FDSOI CMO...
DC and RF characteristics of n-type FinFET transistor over a wide temperature range, from 77 to 473K...
ABSTRACT The existing compact models can reproduce the characteristics of MOSFETs in the temperature...
DoctorWith scaling-down of CMOS technology, problems such as an exponential increase of gate leakage...
Abstract: The electrical properties of sub-0.1 pm gate length LDD devices are investigated between r...
[[abstract]]In this paper, we demonstrate analyses of the effects of temperature (from -50degreesC t...
International audienceIn this review paper, the performance characteristics of Gate-All-Around (GAA)...
We have assessed the use of commercial silicon-on-sapphire CMOS electronics in control circuits, whi...
The electrical properties of sub-0.1 µm gate length LDD devices are investigated between room and li...