A bulge testing system was developed to mechanically characterize the deformation behaviors and elastic moduli of multilayered films, mainly composed of polycrystalline silicon (polysilicon) and lead zirconate titanate (PZT), used in a multilayer actuator of a piezoelectric inkjet head. In the tests, commercial inkjet heads including a few tens of multilayer actuators were directly pressurized by air, and the corresponding deflections were measured via full-field optical measurement techniques. An analytic solution derived from a thin-plate theory and finite-element analysis were used to describe pressure-deflection behaviors of films, and the results were compared with the experimental data to evaluate the elastic modulus of individual fil...
The Young's modulus and strength of polysilicon specimens manufactured in the same production run we...
This paper presents the results of nanoindentation experimental studies of the contact-induced defor...
We investigated the residual stress and Young's modulus of Pb(ZrxTi1 - x)O3 (PZT) thin films with a ...
[[abstract]]The elastic modulus is a very important mechanical property in micromachined structures....
A new MEMS for on-chip mechanical testing of 0.7 µm thick polysilicon film has been designed, modell...
New techniques and procedures are described that enable one to measure the mechanical properties of ...
The issue of mechanical characterization of polysilicon used in Micro Electro Mechanical Systems (M...
A novel, versatile concept of micromachines has been developed to measure the mechanical response of...
We determined the Young’s modulus of pulsed laser deposited epitaxially grown PbZr0.52Ti0.48O3 (PZT)...
This paper presents a technique to determine the Young’s modulus and residual stress of thin films u...
Based on the first resonance frequency measurement of multilayer beams, a simple extraction method h...
AbstractTo apply the nano polycrystalline silicon film (NPSF) to MEMS piezoresistive device effectiv...
This paper aims to investigate the effects of the substrate, the printed line thickness and the sint...
The properties of the materials involved in the set-up of 3D ICs need to be known, when the occurrin...
The Young’s modulus of thin films can be determined by deposition on a micronsized Si cantilever and...
The Young's modulus and strength of polysilicon specimens manufactured in the same production run we...
This paper presents the results of nanoindentation experimental studies of the contact-induced defor...
We investigated the residual stress and Young's modulus of Pb(ZrxTi1 - x)O3 (PZT) thin films with a ...
[[abstract]]The elastic modulus is a very important mechanical property in micromachined structures....
A new MEMS for on-chip mechanical testing of 0.7 µm thick polysilicon film has been designed, modell...
New techniques and procedures are described that enable one to measure the mechanical properties of ...
The issue of mechanical characterization of polysilicon used in Micro Electro Mechanical Systems (M...
A novel, versatile concept of micromachines has been developed to measure the mechanical response of...
We determined the Young’s modulus of pulsed laser deposited epitaxially grown PbZr0.52Ti0.48O3 (PZT)...
This paper presents a technique to determine the Young’s modulus and residual stress of thin films u...
Based on the first resonance frequency measurement of multilayer beams, a simple extraction method h...
AbstractTo apply the nano polycrystalline silicon film (NPSF) to MEMS piezoresistive device effectiv...
This paper aims to investigate the effects of the substrate, the printed line thickness and the sint...
The properties of the materials involved in the set-up of 3D ICs need to be known, when the occurrin...
The Young’s modulus of thin films can be determined by deposition on a micronsized Si cantilever and...
The Young's modulus and strength of polysilicon specimens manufactured in the same production run we...
This paper presents the results of nanoindentation experimental studies of the contact-induced defor...
We investigated the residual stress and Young's modulus of Pb(ZrxTi1 - x)O3 (PZT) thin films with a ...