GaInN/GaN light-emitting triodes having two anodes for promoting the injection of holes into the active region were fabricated and characterized. It was found that the anode-to-anode bias modulates not only the hole-injection efficiency but also the effective light-emitting area and hence the current density through the active region. As the anode-to-anode bias increases, the efficiency at the same current density increases, whereas the efficiency droop decreases substantially, indicating that the limited hole-injection efficiency is one of the dominant mechanisms responsible for the efficiency droop in GaN-based light-emitting diodes. (C) 2011 American Institute of Physics. [doi:10.1063/1.3658388]open111516sciescopu
A p-type InGaN hole reservoir layer (HRL) was designed and incorporated in GaN based light-emitting ...
The p-type AlGaN electron blocking layer (EBL) is widely used in InGaN/GaN light-emitting diodes (LE...
Light emitting diodes(LEDs) based on InGaN suffer from efficiency droop at current injection levels ...
GaN-based light-emitting devices (LEDs) with different electron blocking layers are theoretically st...
In this work, we systematically conduct parametric studies revealing the sensitivity of the hole inj...
Measurements of light-output power versus current are performed for GaInN/GaN light-emitting diodes ...
Physical mechanisms causing the efficiency droop in InGaN/GaN blue light-emitting diodes and remedie...
Efficiency droop, i.e. the loss of efficiency at high operating current, afflicts nitride-based ligh...
To dominate the illumination market, applications of high-power, group III-nitride light-emitting di...
In this study low temperature and high pressure techniques have been used to investigate the recombi...
The effect of strongly-imbalanced carrier concentration and mobility on efficiency droop is studied ...
In this study low temperature and high pressure techniques have been used to investigate the recombi...
Insufficient hole injection is a major impediment to the luminescence efficiency of III-nitride ligh...
At room temperature, AlGaInP pn-junction light-emitting diodes (LEDs) emitting at 630 nm do not exhi...
The quantum efficiency of InGaN/GaN light-emitting diodes (LEDs) has been significantly limited by t...
A p-type InGaN hole reservoir layer (HRL) was designed and incorporated in GaN based light-emitting ...
The p-type AlGaN electron blocking layer (EBL) is widely used in InGaN/GaN light-emitting diodes (LE...
Light emitting diodes(LEDs) based on InGaN suffer from efficiency droop at current injection levels ...
GaN-based light-emitting devices (LEDs) with different electron blocking layers are theoretically st...
In this work, we systematically conduct parametric studies revealing the sensitivity of the hole inj...
Measurements of light-output power versus current are performed for GaInN/GaN light-emitting diodes ...
Physical mechanisms causing the efficiency droop in InGaN/GaN blue light-emitting diodes and remedie...
Efficiency droop, i.e. the loss of efficiency at high operating current, afflicts nitride-based ligh...
To dominate the illumination market, applications of high-power, group III-nitride light-emitting di...
In this study low temperature and high pressure techniques have been used to investigate the recombi...
The effect of strongly-imbalanced carrier concentration and mobility on efficiency droop is studied ...
In this study low temperature and high pressure techniques have been used to investigate the recombi...
Insufficient hole injection is a major impediment to the luminescence efficiency of III-nitride ligh...
At room temperature, AlGaInP pn-junction light-emitting diodes (LEDs) emitting at 630 nm do not exhi...
The quantum efficiency of InGaN/GaN light-emitting diodes (LEDs) has been significantly limited by t...
A p-type InGaN hole reservoir layer (HRL) was designed and incorporated in GaN based light-emitting ...
The p-type AlGaN electron blocking layer (EBL) is widely used in InGaN/GaN light-emitting diodes (LE...
Light emitting diodes(LEDs) based on InGaN suffer from efficiency droop at current injection levels ...