In this work we present the method of magneto-ellipsometry data analysis. Magnetoellipsometry measurements are conducted in situ during nanostructures synthesis. Magnetic field is applied in configuration of magneto-optical transverse Kerr effect. Single-layer model of reflective nanostructures is in focus
The method of effective surface impedance is proposed and applied for in situ characterisation of ma...
Recently, we have shown that the approach of depth sensitivity of magneto-optic ellipsometry can be ...
[[abstract]]Two simple methods were introduced for measuring the magneto-optical Kerr rotation when ...
In this work we present the method of magneto-ellipsometry data analysis. Magnetoellipsometry measur...
Nowadays, the magneto-ellipsometry technique is considered as a promising tool for studying nanostru...
In this work we present the way of nanostructured films study by means of magnetoellipsometry. The m...
Spectral ellipsometry technique is demonstrated to be a useful tool for the investigation of optical...
In this work we report on new magneto-ellipsometry set-up that allows to grow thin films and nanostr...
Текст статьи не публикуется в открытом доступе в соответствии с политикой журнала.A method for proce...
Modern material growth techniques allow for nano-engineering highly complex three dimensionally nano...
Modern material growth techniques allow for nano-engineering highly complex three dimensionally nano...
An approach to analysis of magneto-optical ellipsometry measurements is presented. A two-layer model...
Modification of interfaces in nanostructures can significantly influence their overall properties. M...
The magneto-optical Kerr effect (MOKE) is widely exploited in laboratory-based setups for the study ...
Modern growth techniques allow for highly complex nano scale thin films to be created. These new fil...
The method of effective surface impedance is proposed and applied for in situ characterisation of ma...
Recently, we have shown that the approach of depth sensitivity of magneto-optic ellipsometry can be ...
[[abstract]]Two simple methods were introduced for measuring the magneto-optical Kerr rotation when ...
In this work we present the method of magneto-ellipsometry data analysis. Magnetoellipsometry measur...
Nowadays, the magneto-ellipsometry technique is considered as a promising tool for studying nanostru...
In this work we present the way of nanostructured films study by means of magnetoellipsometry. The m...
Spectral ellipsometry technique is demonstrated to be a useful tool for the investigation of optical...
In this work we report on new magneto-ellipsometry set-up that allows to grow thin films and nanostr...
Текст статьи не публикуется в открытом доступе в соответствии с политикой журнала.A method for proce...
Modern material growth techniques allow for nano-engineering highly complex three dimensionally nano...
Modern material growth techniques allow for nano-engineering highly complex three dimensionally nano...
An approach to analysis of magneto-optical ellipsometry measurements is presented. A two-layer model...
Modification of interfaces in nanostructures can significantly influence their overall properties. M...
The magneto-optical Kerr effect (MOKE) is widely exploited in laboratory-based setups for the study ...
Modern growth techniques allow for highly complex nano scale thin films to be created. These new fil...
The method of effective surface impedance is proposed and applied for in situ characterisation of ma...
Recently, we have shown that the approach of depth sensitivity of magneto-optic ellipsometry can be ...
[[abstract]]Two simple methods were introduced for measuring the magneto-optical Kerr rotation when ...
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