Within the last 2 years our consortium has developed, built and tested an atomic force microscope for planetary science applications, in particular for the study of Martian dust and soil. An array of eight cantilevers and tips provides redundancy in case of tip or cantilever failure. Images can be recorded in both static and dynamic operation modes. As we plan to investigate Martian dust, our interest focuses on the behaviour of the instrument when measuring loose particles in the above-mentioned modes. During scanning, tip contamination with a particle occurs quite frequently, altering the quality of the images. Before changing the cantilever, reverse-imaging the contaminated tip on a tip calibration sample will be performed in order to in...
The atomic force microscope (AFM) is designed to provide high-resolution (in the ideal case, atomic)...
It is demonstrated that a high-temperature-treated (305) surface of a SrTiO3 crystal can be used to ...
Quantitative studies of material properties and interfaces using the atomic force microscope (AFM) h...
The Phoenix Mars Lander includes a Microscopy, Electrochemistry and Conductivity Analyser (MECA) ins...
We have developed, built and tested an atomic force microscope (AFM) for planetary science applica...
The micro and nanostructures of Martian soil simulants with particles in the micrometre-size range h...
The micro and nanostructures of Martian soil simulants with particles in the micrometre-size range h...
The Phoenix Mars Lander includes a Microscopy, Electrochemistry and Conductivity Analyser (MECA) in...
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee,...
The Phoenix microscopy station, designed for the study of Martian dust and soil, consists of a sampl...
We propose a standard sample for Atomic Force Microscopy calibration at the nanoscale, operating in ...
This Ph.D. project is aimed at developing and validating techniques for successful use of Atomic For...
Colloidal gold particles are used as hard, spherical imaging targets to assist in the three‐dimensio...
Suspended dust has a prominent role in Martian climatology. Several significant dust related phenome...
The Atomic Force Microscope (AFM) plays a key role in various disciplines, providing a versatile too...
The atomic force microscope (AFM) is designed to provide high-resolution (in the ideal case, atomic)...
It is demonstrated that a high-temperature-treated (305) surface of a SrTiO3 crystal can be used to ...
Quantitative studies of material properties and interfaces using the atomic force microscope (AFM) h...
The Phoenix Mars Lander includes a Microscopy, Electrochemistry and Conductivity Analyser (MECA) ins...
We have developed, built and tested an atomic force microscope (AFM) for planetary science applica...
The micro and nanostructures of Martian soil simulants with particles in the micrometre-size range h...
The micro and nanostructures of Martian soil simulants with particles in the micrometre-size range h...
The Phoenix Mars Lander includes a Microscopy, Electrochemistry and Conductivity Analyser (MECA) in...
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee,...
The Phoenix microscopy station, designed for the study of Martian dust and soil, consists of a sampl...
We propose a standard sample for Atomic Force Microscopy calibration at the nanoscale, operating in ...
This Ph.D. project is aimed at developing and validating techniques for successful use of Atomic For...
Colloidal gold particles are used as hard, spherical imaging targets to assist in the three‐dimensio...
Suspended dust has a prominent role in Martian climatology. Several significant dust related phenome...
The Atomic Force Microscope (AFM) plays a key role in various disciplines, providing a versatile too...
The atomic force microscope (AFM) is designed to provide high-resolution (in the ideal case, atomic)...
It is demonstrated that a high-temperature-treated (305) surface of a SrTiO3 crystal can be used to ...
Quantitative studies of material properties and interfaces using the atomic force microscope (AFM) h...