Add to ORKGThe activities of the recently created Centre de Microscopie [1-3] at the Ecole Polytechnique Federale of Lausanne cover many different surface and interface research areas: we review here the new techniques based on photoemission spectromicroscopy and free electron laser spectroscopy
If we look around, everything we see is surfaces. What we cannot see, however, are the atomistic and...
The study of semiconductor interfaces and of solid interfaces in general requires novel instrument c...
Photoelectron spectroscopy is now becoming more and more required to investigate electronic structur...
We briefly review the advances in two new domains of surface and interface science: spectromicroscop...
[[abstract]]In 1993/94, ultrabright synchrotron sources of soft X-rays have been commissioned in Tai...
The move of photoemission analysis from the macroscopic to the microscopic domain has been accelerat...
The move of photoemission analysis from the macroscopic to the microscopic domain has been accelerat...
1993 has been full of landmarks for interface research: the new ultrabright soft X-ray synchrotron s...
We present an update on recent events concerning ultrabright synchrotron radiation. First and foremo...
We review the historical and recent development of experimental techniques that are based on the com...
Research using the Advanced Light Source Spectro-microscopy facility is described. Three closely rel...
Several third generation synchrotron radiation facilities are now operational and the high brightnes...
Probed length scales of sub-micrometer dimensions have been achieved in photoemission spectroscopy o...
Progress in the instrumentation and, in particular, in the photon sources makes it possible to imple...
High lateral resolution direct imaging of surfaces with chemical sensitivity is of increasing import...
If we look around, everything we see is surfaces. What we cannot see, however, are the atomistic and...
The study of semiconductor interfaces and of solid interfaces in general requires novel instrument c...
Photoelectron spectroscopy is now becoming more and more required to investigate electronic structur...
We briefly review the advances in two new domains of surface and interface science: spectromicroscop...
[[abstract]]In 1993/94, ultrabright synchrotron sources of soft X-rays have been commissioned in Tai...
The move of photoemission analysis from the macroscopic to the microscopic domain has been accelerat...
The move of photoemission analysis from the macroscopic to the microscopic domain has been accelerat...
1993 has been full of landmarks for interface research: the new ultrabright soft X-ray synchrotron s...
We present an update on recent events concerning ultrabright synchrotron radiation. First and foremo...
We review the historical and recent development of experimental techniques that are based on the com...
Research using the Advanced Light Source Spectro-microscopy facility is described. Three closely rel...
Several third generation synchrotron radiation facilities are now operational and the high brightnes...
Probed length scales of sub-micrometer dimensions have been achieved in photoemission spectroscopy o...
Progress in the instrumentation and, in particular, in the photon sources makes it possible to imple...
High lateral resolution direct imaging of surfaces with chemical sensitivity is of increasing import...
If we look around, everything we see is surfaces. What we cannot see, however, are the atomistic and...
The study of semiconductor interfaces and of solid interfaces in general requires novel instrument c...
Photoelectron spectroscopy is now becoming more and more required to investigate electronic structur...