The geometry of a modern imaging diffractometer is discussed in detail. A method to find all relevant instrument parameters from the control single-crystal measurement data is proposed and the limitations of such a procedure are indicated. Optimization of the instrument parameters by the least-squares method is presented. [References: 19
A FEM model of a double-crystal diffractometer and its metrological analysis is proposed for a compl...
A computer-controlled neutron diffractometer is described for the collection of Bragg intensities fr...
Diffraction Enhanced X-ray Imaging (DEI) uses synchrotron X-ray beams prepared and analyzed by perfe...
With the use of modern single-crystal diffractometers for structure determination, the preliminary p...
A 4-circle diffractometer equipped with a novel imaging system has been installed at HASYLAB beamlin...
The measuring routines of a conventional four-circle diffractometer (Stoe) have been modified to all...
The use of synchrotron radiation (SR) for single-crystal diffraction measurements requires special f...
For the input of the correct intensity-data-collection parameters - the scan width and the number of...
International audienceA 'universal' low temperature device for laboratory x-ray diffractometers equi...
A simple diffractometer is described, in which monochromatic light is focused on a pinhole, rendered...
This work describes a micrometric manipulating device for easy mounting of small crystals on a needl...
[出版社版]The classic instrumentation for collecting high quality single crystal diffraction data for mo...
Diffraction imaging in the far-field can detect 3D morphological features of an object for its coher...
AbstractThis paper extends the work presented in a previous publication (Hansford, 2011 [1], subsequ...
Rapid data collection and modern computing resources provide the opportunity to revisit the task of ...
A FEM model of a double-crystal diffractometer and its metrological analysis is proposed for a compl...
A computer-controlled neutron diffractometer is described for the collection of Bragg intensities fr...
Diffraction Enhanced X-ray Imaging (DEI) uses synchrotron X-ray beams prepared and analyzed by perfe...
With the use of modern single-crystal diffractometers for structure determination, the preliminary p...
A 4-circle diffractometer equipped with a novel imaging system has been installed at HASYLAB beamlin...
The measuring routines of a conventional four-circle diffractometer (Stoe) have been modified to all...
The use of synchrotron radiation (SR) for single-crystal diffraction measurements requires special f...
For the input of the correct intensity-data-collection parameters - the scan width and the number of...
International audienceA 'universal' low temperature device for laboratory x-ray diffractometers equi...
A simple diffractometer is described, in which monochromatic light is focused on a pinhole, rendered...
This work describes a micrometric manipulating device for easy mounting of small crystals on a needl...
[出版社版]The classic instrumentation for collecting high quality single crystal diffraction data for mo...
Diffraction imaging in the far-field can detect 3D morphological features of an object for its coher...
AbstractThis paper extends the work presented in a previous publication (Hansford, 2011 [1], subsequ...
Rapid data collection and modern computing resources provide the opportunity to revisit the task of ...
A FEM model of a double-crystal diffractometer and its metrological analysis is proposed for a compl...
A computer-controlled neutron diffractometer is described for the collection of Bragg intensities fr...
Diffraction Enhanced X-ray Imaging (DEI) uses synchrotron X-ray beams prepared and analyzed by perfe...
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