A graphical tool for an analytical approach of scattering photons by the Compton effect

The photons scattered by the Compton effect can be used to characterize the physical properties of a given sample due to the influence that the electron density exerts on the number of scattered photons. However, scattering measurements involve experimental and physical factors that must be carefully analyzed to predict uncertainty in the detection of Compton photons. This paper presents a method for the optimization of the geometrical parameters of an experimental arrangement for Compton scattering analysis, based on its relations with the energy and incident flux of the X-ray photons. In addition, the tool enables the statistical analysis of the information displayed and includes the coefficient of variation (CV) measurement for a comparative evaluation of the physical parameters of the model established for the simulation. (C) 2012 Elsevier B.V. All rights reserved.Embrapa Agricultural Instrumentation CenterEmbrapa Agricultural Instrumentation Center [03.10.05.011.00.00]Physics Institute of Sao Carlos - IFSCPhysics Institute of Sao Carlos IFSCSao Paulo Research Foundation - FAPESP [09/50405-1]Sao Paulo Research Foundation (FAPESP