Domain Wall Pinning by Step-Like Thickness Change in Magnetic Thin Film

A thin-film element with a steplike thickness change has been fabricated to investigate experimentally a pinning effect of domain walls by a shape control of thin-film devices. Using a Kerr microscope, domain observation has been done to measure pinning characteristics of the element. It has been shown that 40% steplike thickness change of the film thickness can realize a wall pinning, and a pinning field of 2.53 Oe is obtained. The pinning field increases with increasing steplike thickness change ratio