As technology scales, more sophisticated fabrication processes cause variations in many different parameters in the device. These variations could severely affect the performance and power consumption of processors by making the latency of circuits less predictable and thus requiring conservative design approaches and/or techniques to increase performance that often affect power consumption. In this dissertation, we introduce and study step-by-step a 16KB cache subsystem in 32-nm CMOS technology, at both circuit and architecture levels, aiming for a single-cycle process-variation resilient subsystem design in a 1GHz processor that is high performance and power efficient at the same time. We use expected-case simulations in addition to worst...
Power consumption is becoming an increasingly important component of processor design. As technology...
The Process-Variation (PV) effect is a major reliability concern in semiconductor industry as the te...
Improving energy efficiency is critical to increasing computing capability, from mobile devices oper...
As technology scales, more sophisticated fabrication processes cause variations in many different pa...
As technology scales, more sophisticated fabrication processes cause variations in many different pa...
As the CMOS technology continues to scale down for higher performance, power dissipation and robustn...
IEEE Computer Society Annual Symposium on VLSI : April 7-9, 2008 : Montpellier, FranceThe share of l...
As transistor feature sizes continue to shrink into the sub-90nm range and beyond, the effects of pr...
In this thesis, we have investigated the impact of parametric variations on the behaviour of one per...
4th International Workshop on Dependable Embedded Systems : October 9, 2007 : Beijing, ChinaLeakage ...
Process variability and energy consumption are the two most formidable challenges facing the semicon...
In this paper, we propose several different data and instruction cache configurations and analyze th...
Aggressive technology scaling to 14 nm technology node increases variability in transistors performa...
Process parameter variations are expected to be significantly high in a sub-50-nm technology regime,...
Abstract--Leakage and Dynamic power are a major challenge in microprocessor design. Many circuit tec...
Power consumption is becoming an increasingly important component of processor design. As technology...
The Process-Variation (PV) effect is a major reliability concern in semiconductor industry as the te...
Improving energy efficiency is critical to increasing computing capability, from mobile devices oper...
As technology scales, more sophisticated fabrication processes cause variations in many different pa...
As technology scales, more sophisticated fabrication processes cause variations in many different pa...
As the CMOS technology continues to scale down for higher performance, power dissipation and robustn...
IEEE Computer Society Annual Symposium on VLSI : April 7-9, 2008 : Montpellier, FranceThe share of l...
As transistor feature sizes continue to shrink into the sub-90nm range and beyond, the effects of pr...
In this thesis, we have investigated the impact of parametric variations on the behaviour of one per...
4th International Workshop on Dependable Embedded Systems : October 9, 2007 : Beijing, ChinaLeakage ...
Process variability and energy consumption are the two most formidable challenges facing the semicon...
In this paper, we propose several different data and instruction cache configurations and analyze th...
Aggressive technology scaling to 14 nm technology node increases variability in transistors performa...
Process parameter variations are expected to be significantly high in a sub-50-nm technology regime,...
Abstract--Leakage and Dynamic power are a major challenge in microprocessor design. Many circuit tec...
Power consumption is becoming an increasingly important component of processor design. As technology...
The Process-Variation (PV) effect is a major reliability concern in semiconductor industry as the te...
Improving energy efficiency is critical to increasing computing capability, from mobile devices oper...