We investigate a possible dependence between the applied electron dose-rate and the magnitude of the resulting image contrast in HRTEM of inorganic crystalline objects. The present study is focussed on the question whether electron irradiation can induce excessively strong atom vibrations or displacements, which in turn could significantly reduce the resulting image contrast. For this purpose, high-resolution images of MgO, Ge, and Au samples were acquired with varying dose rates using a CS-corrected FEI Titan 80–300 microscope operated at 300 kV accelerating voltage. This investigation shows that the magnitude of the signal contrast is independent from the dose rates occurring in conventional HRTEM experiments and that excessively strong v...
We review the use of transmission electron microscopy (TEM) and associated techniques for the analys...
Materials scientists have come to rely on the fact that high-resolution transmission electron micros...
© 2011 Dr. Nathan Robert LuggTransmission electron microscopy (TEM) is a powerful technique for stud...
It has long been known that cryo-EM specimens are severely damaged by a level of electron exposure t...
Electron radiation damage is an important topic in electron microscopy. A large proportion of materi...
Radiation damage places a fundamental limitation on the ability of microscopy to resolve many types ...
High-resolution electron microscopy (HREM) images of silicalite (ZSM-5) along [010] were taken with ...
We report on the observability of valence bonding effects in aberration-corrected high resolution el...
In a recent article [1] we examined the influence of the applied electron dose rate on the magnitude...
Radiation damage is an important resolution limiting factor both in macromolecular X-ray crystallogr...
Crystal damage induced by irradiation is investigated using transmission electron microscopy (TEM) c...
The chemical analysis on the atomic scale in a scanning transmission electron microscope bears a num...
Imaging of biomolecules by ionizing radiation, such as electrons, causes radiation damage which intr...
The highly energetic electrons in a transmission electron microscope (TEM) can alter or even complet...
While aberration correction for scanning transmission electron microscopes (STEMs) dramatically incr...
We review the use of transmission electron microscopy (TEM) and associated techniques for the analys...
Materials scientists have come to rely on the fact that high-resolution transmission electron micros...
© 2011 Dr. Nathan Robert LuggTransmission electron microscopy (TEM) is a powerful technique for stud...
It has long been known that cryo-EM specimens are severely damaged by a level of electron exposure t...
Electron radiation damage is an important topic in electron microscopy. A large proportion of materi...
Radiation damage places a fundamental limitation on the ability of microscopy to resolve many types ...
High-resolution electron microscopy (HREM) images of silicalite (ZSM-5) along [010] were taken with ...
We report on the observability of valence bonding effects in aberration-corrected high resolution el...
In a recent article [1] we examined the influence of the applied electron dose rate on the magnitude...
Radiation damage is an important resolution limiting factor both in macromolecular X-ray crystallogr...
Crystal damage induced by irradiation is investigated using transmission electron microscopy (TEM) c...
The chemical analysis on the atomic scale in a scanning transmission electron microscope bears a num...
Imaging of biomolecules by ionizing radiation, such as electrons, causes radiation damage which intr...
The highly energetic electrons in a transmission electron microscope (TEM) can alter or even complet...
While aberration correction for scanning transmission electron microscopes (STEMs) dramatically incr...
We review the use of transmission electron microscopy (TEM) and associated techniques for the analys...
Materials scientists have come to rely on the fact that high-resolution transmission electron micros...
© 2011 Dr. Nathan Robert LuggTransmission electron microscopy (TEM) is a powerful technique for stud...