Nanostructure property analysis in a transmission electron microscope

Understanding mechanical, electrical, thermal, thermoelectric, optical, optoelectronic and photovoltaic properties of a nanomaterial, in particular on the individual nanostructure level, is of key importance as far as its effective integration into any modern technology is concerned. However, in the vast majority of cases, these property measurements have been performed by means of instruments with no direct access to the nanomaterials’ atomic structure, its crystallography, spatially-resolved chemistry and existing point and/or linear structural defects. This fact largely limits the relevance of the collected data because all particular structural features of a nanoscale object prior, during and after its testing have typically been hidden..