Design, Fabrication and Measurement Polymethylmethacrylate Optical Waveguides Prepared by Modification of Surface Profile by Applying Electric Field

In this paper, we describe results of our recent experiments on electric field preparation of the optical waveguides on PMMA films, their calculation and measurements. Planar PMMA films were prepared on Si/SiO2 wafers and measured using waveguiding technique. Micro-sized patterns were created on thin PMMA films by the effect of external electric field, perpendicular to the film surface. Waveguiding properties of prepared structures were checked by fitting optical fibre connected to laser light source. Optical losses of the farbicated channel waveguides were measured by using the cut-back method at wavelength 650 nm and output field was obtained by beam propagation analyzer BP104IR. Properties of the PMMA layers were simulated by beam propagation method by using BeamProp module from RSoft software