Proposal for combined conducted and radiated emission modeling for Integrated Circuit

This paper describes a methodology to build a combined conducted and radiated emission model for integrated circuits. The development of emission models of a FPGA extracted from two different approaches is presented and discussed. The first approach allows to build a predictable model from FPGA implementation and some passive measurement on FPGA device. The second approach allows to build a model from only NFS measurement. In conclusion, the accuracy of both models as well as the advantages and disadvantages are discusse