Part 3: Session 3: Parallel ArchitecturesInternational audienceIn a multiprocessor array, some processing elements (PEs) fail to function normally due to hardware defects or soft faults caused by overheating, overload or occupancy by other running applications. Fault-tolerant reconfiguration considered in this paper is to reorganize fault-free PEs from a processor array with faults to a logical array of regular mesh topology by changing the interconnections among PEs. This paper presents the efficiency of the flexible rerouting scheme to maximize the usage of the fault-free PEs, by developing an efficient reconfiguration algorithm without backtracking. The proposed algorithm constructs each logical columns from left to right on candidate PE...
In this paper, new heuristic-search methods and algorithms are presented for enabling highly efficie...
This paper addresses the NP-complete problem of reconfiguring two-dimensional degradable processor a...
Vita.This dissertation present new approaches for testing and reconfiguring several types of wafer-s...
This paper investigates the techniques to construct high-quality target processor array (fault-free ...
With few exceptions, the two issues of algorithm design and fault tolerance for processor arrays hav...
In this paper we consider the problem of reconfiguring processor arrays subject to computational loa...
In large VLSI/WSI arrays, improved reliability and yield can be obtained through reconfiguration tec...
Recent trends in transistor technology have dictated the constant reduction of device size. One nega...
. Fault tolerance through the incorporation of redundancy and reconfiguration is quite common. In a ...
The problem of reconfiguring two-dimensional VLSI arrays with faults is to find a maximum logical ar...
AbstractAchieving fault tolerance through incorporation of redundancy and reconfiguration is quite c...
Reducing the interconnection length of VLSI arrays leads to less capacitance, power dissipation and ...
In this thesis, several design, analysis and reconfiguration problems in defect-tolerant VLSI and pa...
This paper proposes an efficient techniques to reconfigure a two-dimensional degradable very large s...
In this article, new heuristic-search methods and algorithms are presented for enabling highly effic...
In this paper, new heuristic-search methods and algorithms are presented for enabling highly efficie...
This paper addresses the NP-complete problem of reconfiguring two-dimensional degradable processor a...
Vita.This dissertation present new approaches for testing and reconfiguring several types of wafer-s...
This paper investigates the techniques to construct high-quality target processor array (fault-free ...
With few exceptions, the two issues of algorithm design and fault tolerance for processor arrays hav...
In this paper we consider the problem of reconfiguring processor arrays subject to computational loa...
In large VLSI/WSI arrays, improved reliability and yield can be obtained through reconfiguration tec...
Recent trends in transistor technology have dictated the constant reduction of device size. One nega...
. Fault tolerance through the incorporation of redundancy and reconfiguration is quite common. In a ...
The problem of reconfiguring two-dimensional VLSI arrays with faults is to find a maximum logical ar...
AbstractAchieving fault tolerance through incorporation of redundancy and reconfiguration is quite c...
Reducing the interconnection length of VLSI arrays leads to less capacitance, power dissipation and ...
In this thesis, several design, analysis and reconfiguration problems in defect-tolerant VLSI and pa...
This paper proposes an efficient techniques to reconfigure a two-dimensional degradable very large s...
In this article, new heuristic-search methods and algorithms are presented for enabling highly effic...
In this paper, new heuristic-search methods and algorithms are presented for enabling highly efficie...
This paper addresses the NP-complete problem of reconfiguring two-dimensional degradable processor a...
Vita.This dissertation present new approaches for testing and reconfiguring several types of wafer-s...