The effects of changing the acceptors concentration on the electrical characteristics of Au/Ti on Be-doped Al0.29Ga0.71As Schottky contact have been investigated in the temperature range of 100–400 K. Using three devices with three different doping levels, the barrier height (ΦB), ideality factor (n) and series resistance (RS) for each diode were evaluated using both thermionic emission (TE) theory and Cheung's method. Our experimental results showed that the sample with a moderate doping concentration of 3×1016 cm-3 has the best performance, including ideality factor of 1.25 and rectification ratio of 2.24×103 at room temperature. All samples showed an abnormal behavior of reducing ΦB and increasing n with increase of temperature. This beh...
This paper investigates the behaviour of the reverse-bias leakage current of the Schottky diode with...
Cataloged from PDF version of article.We investigated the behavior of the forward bias current-volta...
The current-voltage (I-V) and capacitance-voltage (C-V) characteristics of p-In2Te3/Al thin films Sc...
The effects of changing the acceptors concentration on the electrical characteristics of Au/Ti on Be...
The temperature effect on the electrical characteristics of Au/Ti on Beryllium-doped Al0.29Ga0.71As ...
In this work, a recent heuristic method called Dragonfly Algorithm (DA) has been employed for the fi...
The barrier height and ideality factor of Au/n-GaAs Schottky diodes grown by metal-organic vapor-pha...
The current-voltage characteristics of Au=low doped n-GaAs Schottky diodes were determined at va...
The barrier height and ideality factor of Au/n-GaAs Schottky diodes grown by metal-organic vapor-pha...
The work presents temperature dependent forward and reverse current-voltage (I-V) analyses of n-GaAs...
We have observed a degradation in the epitaxial layer quality of AlInAs when it is grown by molecula...
The current-voltage (I-V) characteristics of the Ni/Al026Ga0.74N Schottky barrier diodes (SBDs) were...
MIS Schottky diodes on Al0.75Ga0.25As/In0.2Ga0.8As PHEMTs were produced using both photowashing and ...
The fabrication of Al-pSnSe Schottky diodes and the temperature dependence of I-V characteristics in...
Incorporation of beryllium (Be) and tellurium (Te) dopants in epitaxially grown Al0.9Ga0.1As0.06Sb0....
This paper investigates the behaviour of the reverse-bias leakage current of the Schottky diode with...
Cataloged from PDF version of article.We investigated the behavior of the forward bias current-volta...
The current-voltage (I-V) and capacitance-voltage (C-V) characteristics of p-In2Te3/Al thin films Sc...
The effects of changing the acceptors concentration on the electrical characteristics of Au/Ti on Be...
The temperature effect on the electrical characteristics of Au/Ti on Beryllium-doped Al0.29Ga0.71As ...
In this work, a recent heuristic method called Dragonfly Algorithm (DA) has been employed for the fi...
The barrier height and ideality factor of Au/n-GaAs Schottky diodes grown by metal-organic vapor-pha...
The current-voltage characteristics of Au=low doped n-GaAs Schottky diodes were determined at va...
The barrier height and ideality factor of Au/n-GaAs Schottky diodes grown by metal-organic vapor-pha...
The work presents temperature dependent forward and reverse current-voltage (I-V) analyses of n-GaAs...
We have observed a degradation in the epitaxial layer quality of AlInAs when it is grown by molecula...
The current-voltage (I-V) characteristics of the Ni/Al026Ga0.74N Schottky barrier diodes (SBDs) were...
MIS Schottky diodes on Al0.75Ga0.25As/In0.2Ga0.8As PHEMTs were produced using both photowashing and ...
The fabrication of Al-pSnSe Schottky diodes and the temperature dependence of I-V characteristics in...
Incorporation of beryllium (Be) and tellurium (Te) dopants in epitaxially grown Al0.9Ga0.1As0.06Sb0....
This paper investigates the behaviour of the reverse-bias leakage current of the Schottky diode with...
Cataloged from PDF version of article.We investigated the behavior of the forward bias current-volta...
The current-voltage (I-V) and capacitance-voltage (C-V) characteristics of p-In2Te3/Al thin films Sc...