Surface Characterization of Antireflective Thin Films

Optical properties (refractive index, reflectance, transmission) were determined, and discussed in connection with surface morphology of films studied by means of atomic force microscopy (AFM). The surface roughness and anti-reflection index depends on film preparation conditions. The highest transmission (up to 96,1%) in the range of 200 to 1100 nm was obtained for both side four layers deposited glass samples. Results of present study show that environmental factors do not change quality of film surface and light reflection