Characterization of the microstructure and pores in fine-grained geo-materials like mudstones is challenging because of their heterogeneity and small pore sizes. Combining Broad Ion Beam (BIB) polishing and Scanning Electron Microscopy (SEM) enables the visualization of microstructure and pores from millimetres down to a few nanometres in size. In the SEM, the BIB-polished section is mapped at high magnification with various detectors and the different features are segmented and quantified using image processing algorithms. This technology is applied on undeformed and naturally or experimentally deformed rock samples to analyse the strain behaviour of potential host rock formations of nuclear waste such as the Boom Clay and Callovian-Oxford...
International audienceThe Callovo-Oxfordian mudstone (Meuse/Haute-Marne, France) is currently consid...
Using a focused ion beam (FIB) instrument, electron-transparent samples (termed foils) have been cut...
The development of focused ion beam-scanning electron microscopy (FIB-SEM) techniques has allowed hi...
The application of ion-beam milling techniques to clays allows investigation of the porosity at nm r...
Detailed investigation of the morphology of the pore space in clay is a key fact...
Host and reservoir rocks like rock salts, clay stones, shales and tight gas sandstones are of major ...
Clay rich formations are investigated thoroughly as candidate host rocks for the deep geological sto...
A combination of Broad-Ion-Beam (BIB) polishing and Scanning Electron Microscopy (SEM) has been used...
Berea sandstone is the building block for reservoirs containing precious hydrocarbon fuel. In this s...
We used Broad-Ion-Beam polishing in combination with Scanning Electron Microscopy to study the micro...
Tomographic analysis using focused ion beam-scanning electron microscopy (FIB-SEM) provides three-di...
Tomographic analysis using focused ion beam-scanning electron microscopy (FIB-SEM) provides three-di...
© 2016, European Association of Geoscientists and Engineers. All rights reserved.Porosity and pore c...
Study of the pore space in mudstones by mercury intrusion porosimetry is a common but indirect techn...
eEarth Morphology of the pore space in claystones – evidence from BIB/FIB ion beam sectioning and cr...
International audienceThe Callovo-Oxfordian mudstone (Meuse/Haute-Marne, France) is currently consid...
Using a focused ion beam (FIB) instrument, electron-transparent samples (termed foils) have been cut...
The development of focused ion beam-scanning electron microscopy (FIB-SEM) techniques has allowed hi...
The application of ion-beam milling techniques to clays allows investigation of the porosity at nm r...
Detailed investigation of the morphology of the pore space in clay is a key fact...
Host and reservoir rocks like rock salts, clay stones, shales and tight gas sandstones are of major ...
Clay rich formations are investigated thoroughly as candidate host rocks for the deep geological sto...
A combination of Broad-Ion-Beam (BIB) polishing and Scanning Electron Microscopy (SEM) has been used...
Berea sandstone is the building block for reservoirs containing precious hydrocarbon fuel. In this s...
We used Broad-Ion-Beam polishing in combination with Scanning Electron Microscopy to study the micro...
Tomographic analysis using focused ion beam-scanning electron microscopy (FIB-SEM) provides three-di...
Tomographic analysis using focused ion beam-scanning electron microscopy (FIB-SEM) provides three-di...
© 2016, European Association of Geoscientists and Engineers. All rights reserved.Porosity and pore c...
Study of the pore space in mudstones by mercury intrusion porosimetry is a common but indirect techn...
eEarth Morphology of the pore space in claystones – evidence from BIB/FIB ion beam sectioning and cr...
International audienceThe Callovo-Oxfordian mudstone (Meuse/Haute-Marne, France) is currently consid...
Using a focused ion beam (FIB) instrument, electron-transparent samples (termed foils) have been cut...
The development of focused ion beam-scanning electron microscopy (FIB-SEM) techniques has allowed hi...