Thin films of PbTiO3, a classical ferroelectric, have been grown under tensile strain on single-crystal substrates of DyScO3. The films, of only 5 nm thickness, grow fully coherent with the substrate, as evidenced by synchrotron x-ray diffraction. A mapping of the reciprocal space reveals intensity modulations (satellites) due to regularly spaced polar domains in which the polarization appears rotated away from the substrate normal, characterizing a low-symmetry phase not observed in the bulk material. This could have important practical implications since these phases are known to be responsible for ultrahigh piezoelectric responses in complex systems.
Strain engineering enables modification of the properties of thin films using the stress from the su...
Strain engineering enables modification of the properties of thin films using the stress from the su...
Strain engineering enables modification of the properties of thin films using the stress from the su...
Thin films of PbTiO3, a classical ferroelectric, have been grown under tensile strain on single-crys...
Thin films of PbTiO3, a classical ferroelectric, have been grown under tensile strain on single-crys...
Thin films of PbTiO3, a classical ferroelectric, have been grown under tensile strain on single-crys...
Thin films of PbTiO3, a classical ferroelectric, have been grown under tensile strain on single-crys...
Thin films of PbTiO3, a classical ferroelectric, have been grown under tensile strain on single-crys...
X-ray diffraction constitutes a powerful technique with which to characterise ferroelectric domains....
X-ray diffraction constitutes a powerful technique with which to characterise ferroelectric domains....
X-ray diffraction constitutes a powerful technique with which to characterise ferroelectric domains....
X-ray diffraction constitutes a powerful technique with which to characterise ferroelectric domains....
Strain engineering enables modification of the properties of thin films using the stress from the su...
Strain engineering enables modification of the properties of thin films using the stress from the su...
Strain engineering enables modification of the properties of thin films using the stress from the su...
Strain engineering enables modification of the properties of thin films using the stress from the su...
Strain engineering enables modification of the properties of thin films using the stress from the su...
Strain engineering enables modification of the properties of thin films using the stress from the su...
Thin films of PbTiO3, a classical ferroelectric, have been grown under tensile strain on single-crys...
Thin films of PbTiO3, a classical ferroelectric, have been grown under tensile strain on single-crys...
Thin films of PbTiO3, a classical ferroelectric, have been grown under tensile strain on single-crys...
Thin films of PbTiO3, a classical ferroelectric, have been grown under tensile strain on single-crys...
Thin films of PbTiO3, a classical ferroelectric, have been grown under tensile strain on single-crys...
X-ray diffraction constitutes a powerful technique with which to characterise ferroelectric domains....
X-ray diffraction constitutes a powerful technique with which to characterise ferroelectric domains....
X-ray diffraction constitutes a powerful technique with which to characterise ferroelectric domains....
X-ray diffraction constitutes a powerful technique with which to characterise ferroelectric domains....
Strain engineering enables modification of the properties of thin films using the stress from the su...
Strain engineering enables modification of the properties of thin films using the stress from the su...
Strain engineering enables modification of the properties of thin films using the stress from the su...
Strain engineering enables modification of the properties of thin films using the stress from the su...
Strain engineering enables modification of the properties of thin films using the stress from the su...
Strain engineering enables modification of the properties of thin films using the stress from the su...