Temperature dependence of the interface moments in Co2MnSi thin films
- Telling, N.D.
- Keatley, Paul Steven
- Shelford, L.R.
- Arenholz, E.
- van der Laan, Gerrit
- Hicken, R.J.
- Sakuraba, Y.
- Tsunegi, S.
- Oogane, M.
- Ando, Y.
- Takanashi, K.
- Miyazaki, T.
Publication date
March 2013
DOI Publisher
AIP Publishing Journal
Applied Physics LettersAbstract
Copyright © 2008 American Institute of PhysicsX-ray magnetic circular dichroism (XMCD) is utilized to explore the temperature dependence of the interface moments in Co2MnSi (CMS) thin films capped with aluminum. By increasing the thickness of the capping layer, we demonstrate enhanced interface sensitivity of the measurements. L2(1)-ordered CMS films show no significant temperature dependence of either the Co or Mn interface moments. However, disordered CMS films show a decreased moment at low temperature possibly caused by increased Mn-Mn antiferromagnetic coupling. It is suggested that for ordered L2(1) CMS films the temperature dependence of the tunneling magnetoresistance is not related to changes in the interface moments
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