One of the important effects of the space environment on the satellites and spacecrafts is the single event upsets (SEUs) which are caused by the high energy particles in space. A SEU occurs when an ionizing radiation produces a burst of electron-hole pairs in a digital microelectronic circuit and causes the charge state to change. We have developed and integrated a software package which can estimate the SEU rates for any specified locations or altitudes under various geophysical conditions. We report in this paper the algorithm of the software and the results for some devices with known parameters. We also compare the results with actual observations made by Akebono
This paper describes a comparison between in-orbit single-event effects (SEE) rate measurement acqui...
A method for constructing upper bound estimates for device single event upset (SEU) rates is present...
This thesis presents an investigation into methods for predicting and improving the reliability of e...
In this paper, we present software tools for predicting the rate and nature of observable SEU induce...
International audienceThis work presents an approach to predict the error rates due to Single Event ...
In this paper are first summarized representative examples of anomalies observed in systems operatin...
During a solar particle event (SPE) a spacecraft can suffer a large number of single event effect (S...
In this paper, space radiation environment and single event effect(SEE) have been analyzed for the K...
Radiation encountered in space environments can be damaging to microelectronics and potentially caus...
ISBN : 978-1-4244-1665-3International audienceThis paper deals with the prediction of SEU error rate...
Single event upset (SEU) and latchup vulnerabilities were determined for a number of parts of intere...
Until recently, the effects of radiation environment on on-board electronics on launchers and aircra...
International Telemetering Conference Proceedings / October 22-25, 1984 / Riviera Hotel, Las Vegas, ...
State-of-the-art commercial microprocessors are attractive for use in cost effective space missions ...
Recent improvements in the radiation transport code HZETRN/BRYNTRN and galactic cosmic ray environme...
This paper describes a comparison between in-orbit single-event effects (SEE) rate measurement acqui...
A method for constructing upper bound estimates for device single event upset (SEU) rates is present...
This thesis presents an investigation into methods for predicting and improving the reliability of e...
In this paper, we present software tools for predicting the rate and nature of observable SEU induce...
International audienceThis work presents an approach to predict the error rates due to Single Event ...
In this paper are first summarized representative examples of anomalies observed in systems operatin...
During a solar particle event (SPE) a spacecraft can suffer a large number of single event effect (S...
In this paper, space radiation environment and single event effect(SEE) have been analyzed for the K...
Radiation encountered in space environments can be damaging to microelectronics and potentially caus...
ISBN : 978-1-4244-1665-3International audienceThis paper deals with the prediction of SEU error rate...
Single event upset (SEU) and latchup vulnerabilities were determined for a number of parts of intere...
Until recently, the effects of radiation environment on on-board electronics on launchers and aircra...
International Telemetering Conference Proceedings / October 22-25, 1984 / Riviera Hotel, Las Vegas, ...
State-of-the-art commercial microprocessors are attractive for use in cost effective space missions ...
Recent improvements in the radiation transport code HZETRN/BRYNTRN and galactic cosmic ray environme...
This paper describes a comparison between in-orbit single-event effects (SEE) rate measurement acqui...
A method for constructing upper bound estimates for device single event upset (SEU) rates is present...
This thesis presents an investigation into methods for predicting and improving the reliability of e...