This study addresses the mechanics of the relatively brittle solder/intermetallic (IMC) interface fracture process using damage mechanics concept. The damage state, ¿ of a material point in the solder/IMC interface, is expressed in terms of orthogonal traction components in a quadratic failure criterion of a cohesive zone model. The model is then employed in a finite element analysis of a solder ball shear push test. The simulated test specimen consists of reflowed SAC405 solder-on-OSP copper pad and orthotropic FR4 substrate. Unified inelastic strain constitutive model with optimized material parameters describes the strain rate-response of the SAC405 solder. The cohesive zone model parameter values are compiled from published experimenta...
The main goal of this paper is to shed light on the effect of strain rate and viscoplastic deformati...
The fracture behavior of the Cu/Sn-3.0Ag-0.5Sn (SAC305)/Cu solder joint was investigated by conducti...
Adhesively bonded joints within most electronic devices are constantly subjected to a complex combin...
The relatively brittle solder/IMC interface fracture process in reflowed solder joints is examined u...
The current formulation of stress- and energy-based cohesive zone model (CZM) is extended to account...
The current formulation of stress- and energy-based cohesive zone model (CZM) is extended to account...
Solder joints in the electronics products are considered as critical reliability concerns. In this r...
The mechanics of failure in a solder joint under cyclic mechanical loading is quantified and describ...
The trend towards miniaturization of electronic products leads to the need for very small sized sold...
The trend toward the miniaturization of electronic products leads to the need for very small sized s...
Solder joint reliability (SJR) is an important requirement in electronics packaging. Most of the fai...
In the current work, a test scheme to evaluate solder joint interface fracture toughness using doubl...
A comprehensive experimental study on the brittle fracture of intermetallic compounds (IMCs) of a Pb...
This study examines the dynamic fracture propagation experienced by critical solder joints in a BGA ...
When dropped, electronic packages often undergo failure by propagation of an interfacial crack in so...
The main goal of this paper is to shed light on the effect of strain rate and viscoplastic deformati...
The fracture behavior of the Cu/Sn-3.0Ag-0.5Sn (SAC305)/Cu solder joint was investigated by conducti...
Adhesively bonded joints within most electronic devices are constantly subjected to a complex combin...
The relatively brittle solder/IMC interface fracture process in reflowed solder joints is examined u...
The current formulation of stress- and energy-based cohesive zone model (CZM) is extended to account...
The current formulation of stress- and energy-based cohesive zone model (CZM) is extended to account...
Solder joints in the electronics products are considered as critical reliability concerns. In this r...
The mechanics of failure in a solder joint under cyclic mechanical loading is quantified and describ...
The trend towards miniaturization of electronic products leads to the need for very small sized sold...
The trend toward the miniaturization of electronic products leads to the need for very small sized s...
Solder joint reliability (SJR) is an important requirement in electronics packaging. Most of the fai...
In the current work, a test scheme to evaluate solder joint interface fracture toughness using doubl...
A comprehensive experimental study on the brittle fracture of intermetallic compounds (IMCs) of a Pb...
This study examines the dynamic fracture propagation experienced by critical solder joints in a BGA ...
When dropped, electronic packages often undergo failure by propagation of an interfacial crack in so...
The main goal of this paper is to shed light on the effect of strain rate and viscoplastic deformati...
The fracture behavior of the Cu/Sn-3.0Ag-0.5Sn (SAC305)/Cu solder joint was investigated by conducti...
Adhesively bonded joints within most electronic devices are constantly subjected to a complex combin...