Analysis of electron diffraction patterns from carbon nanotubes with image processing to determine structural parameters

In this PhD-thesis a method was developed, which offers the possibility to analyze electron diffraction patterns from carbon nanotubes automatically with a computer program to determine the chiral indices n and m. Diffraction patterns of single-walled nanotubes can be evaluated as well as images of multi-walled tubes or bundles of tubes. To be able to verify the results of the algorithm, a simulation program was written, which produces diffraction patterns, that are similar to real ones, i.e. they contain noise, a beamstopper and an undiffracted electron beam