This paper applies an improved method for testing the signal-to-noise ratio (SNR) of Analogue-to-Digital Converters (ADC). In previous work, a noisy and nonlinear pulse signal is exploited as the input stimulus to obtain the signature results of ADC. By applying a machine-learning-based approach, the dynamic parameters can be predicted by using the signature results. However, it can only estimate the SNR accurately within a certain range. In order to overcome this limitation, an improved method based on work is applied in this work. It is validated on the Labview model of a 12-bit 80 Ms/s pipelined ADC with a pulse- wave input signal of 3 LSB noise and 7-bit nonlinear rising and falling edges
Analog-to-digital converter (ADC) is the main workhorse in a digital waveform recorder. Strictly spe...
This paper reports two novel algorithms based on time-modulo reconstruction method intended for dete...
This paper deals with the effectiveness of the Sinewave Histogram Test (SHT) for testing analog to D...
This paper applies an improved method for testing the signal-to-noise ratio (SNR) of Analogue-to-Dig...
A new method is presented to test dynamic parameters of Analogue-to-Digital Converters (ADC). A nois...
Abstract—In the conventional ADC production test method, a high-quality analogue sine wave is applie...
The Analogue-to-Digital Converter (ADC) is one of the most typical and widely used mixed-signal circ...
In the conventional ADC production test method, a high-quality analogue sine wave is applied to the ...
International audienceTesting analog, mixed-signal and RF circuits rep- resents the main cost compon...
In this paper, two improved methods are presented extending our previous work. The first one improve...
In this brief, we demonstrate the procedures of linear model-based testing for the example of a 12-b...
Abstract—Linearity testing of analog-to-digital converters (ADCs) can be very challenging because it...
Abstract:- In the past two decades, the techniques of artificial neural networks are growing mature,...
The task of determining low noise amplifier (LNA) high-frequency performance in functional testing ...
Sigma–Delta (ΣΔ) modulators have made possible the design of high-resolution Analogue-to-Digital Con...
Analog-to-digital converter (ADC) is the main workhorse in a digital waveform recorder. Strictly spe...
This paper reports two novel algorithms based on time-modulo reconstruction method intended for dete...
This paper deals with the effectiveness of the Sinewave Histogram Test (SHT) for testing analog to D...
This paper applies an improved method for testing the signal-to-noise ratio (SNR) of Analogue-to-Dig...
A new method is presented to test dynamic parameters of Analogue-to-Digital Converters (ADC). A nois...
Abstract—In the conventional ADC production test method, a high-quality analogue sine wave is applie...
The Analogue-to-Digital Converter (ADC) is one of the most typical and widely used mixed-signal circ...
In the conventional ADC production test method, a high-quality analogue sine wave is applied to the ...
International audienceTesting analog, mixed-signal and RF circuits rep- resents the main cost compon...
In this paper, two improved methods are presented extending our previous work. The first one improve...
In this brief, we demonstrate the procedures of linear model-based testing for the example of a 12-b...
Abstract—Linearity testing of analog-to-digital converters (ADCs) can be very challenging because it...
Abstract:- In the past two decades, the techniques of artificial neural networks are growing mature,...
The task of determining low noise amplifier (LNA) high-frequency performance in functional testing ...
Sigma–Delta (ΣΔ) modulators have made possible the design of high-resolution Analogue-to-Digital Con...
Analog-to-digital converter (ADC) is the main workhorse in a digital waveform recorder. Strictly spe...
This paper reports two novel algorithms based on time-modulo reconstruction method intended for dete...
This paper deals with the effectiveness of the Sinewave Histogram Test (SHT) for testing analog to D...