Add to ORKGProblems in testing scannable sequential circuits for delay faults are addressed. Modifications to improve circuit controllability and observability for the testing of delay faults are implemented efficiently in a scan cell design. A layout on a gate array is designed and evaluated for this scan cel
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomp...
UnrestrictedAs VLSI fabrication process continues to advance and device and interconnect dimensions ...
To guarantee the temporal correctness of a digital circuit a set of multiple path delay faults calle...
Problems in testing scannable sequential circuits for delay faults are addressed. Modifications to i...
MO- WORK REPOmD on delay testing is applicable only to the scan type of circuits. This restricted pr...
This new method allows any sequential-circuit test generation program to produce path delay tests fo...
International audienceDelay testing that requires the application of consecutive two-pattern tests i...
Abstract — With increasing process fluctuations in nano-scale technology, testing for delay faults i...
Also in: European Test Workshop (ETW), 27 au 29 mai 1998, Barcelona, Espagne, pp. 44-48International...
As the clock frequency and complexity of digital integrated circuits increase rapidly, delay testing...
Delay fault testing and at-speed testing are widely used to verify the timing of synchronous digita...
Modern day IC design has drawn a lot of attention towards the path delay fault model (PDF) [1], whic...
This article presents a technique for the extension of delay fault test pattern generation to synchr...
This paper applies model checker-based testing, a well-known method from software engineering, to th...
Enhanced Scan design can significantly improve the fault coverage for two pattern delay tests at the...
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomp...
UnrestrictedAs VLSI fabrication process continues to advance and device and interconnect dimensions ...
To guarantee the temporal correctness of a digital circuit a set of multiple path delay faults calle...
Problems in testing scannable sequential circuits for delay faults are addressed. Modifications to i...
MO- WORK REPOmD on delay testing is applicable only to the scan type of circuits. This restricted pr...
This new method allows any sequential-circuit test generation program to produce path delay tests fo...
International audienceDelay testing that requires the application of consecutive two-pattern tests i...
Abstract — With increasing process fluctuations in nano-scale technology, testing for delay faults i...
Also in: European Test Workshop (ETW), 27 au 29 mai 1998, Barcelona, Espagne, pp. 44-48International...
As the clock frequency and complexity of digital integrated circuits increase rapidly, delay testing...
Delay fault testing and at-speed testing are widely used to verify the timing of synchronous digita...
Modern day IC design has drawn a lot of attention towards the path delay fault model (PDF) [1], whic...
This article presents a technique for the extension of delay fault test pattern generation to synchr...
This paper applies model checker-based testing, a well-known method from software engineering, to th...
Enhanced Scan design can significantly improve the fault coverage for two pattern delay tests at the...
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomp...
UnrestrictedAs VLSI fabrication process continues to advance and device and interconnect dimensions ...
To guarantee the temporal correctness of a digital circuit a set of multiple path delay faults calle...