The next generation of optical instruments, including telescopes and imaging apparatus, will generate an increased requirement for larger and more complex optical forms. A major limiting factor for the production of such optical components is the metrology: how do we measure such parts and with respect to what reference datum This metrology can be thought of as part of a complete cycle in the production of optical components and it is currently the most challenging aspect of production. This thesis investigates a new and complete approach to stitching optical metrology data to extend the effective aperture or, in future, the dynamic range of optical metrology instruments. A practical approach is used to build up a complete process for stitc...
New optical designs strive to achieve extreme performance, and continually increase the complexity o...
Nonflatness of stage mirror surface affects the position accuracy of the wafer stage in lithography ...
A metrology system for measuring aspheric test objects by subaperture stitching. A wavefront-measuri...
AbstractIn this work we examine how stitching interferometry can be used to provide both absolute ca...
The demand for customised optical devices is increasing tremendously. Such optical devices do not em...
In this thesis, the problem of the metrology of optical surfaces is examined. The need for accurate ...
Precision optics are a guarantor for production and quality control in many different sectors of hig...
Les synchrotrons utilisent une grande diversité de miroirs pour conditionner ou rediriger le faiscea...
Modern industries are stressed by the market for a crazy and continuous reduction of time-to-market ...
The measurement of parts of high geometrical complexity, such as those fabricated via additive manuf...
New, unconventional designs for modern optical systems strive for superior performance at lower cost...
In this paper, we describe the progress being made in the development of stitching interferometry fo...
Optical instruments are widely used for precision surface measurement. However, the dynamic range of...
Manufacturing has recently experienced increased adoption of optimised and fast solutions for checki...
Synchrotrons use a variety of mirrors for reshaping or redirecting X-ray beams. The mirrors can have...
New optical designs strive to achieve extreme performance, and continually increase the complexity o...
Nonflatness of stage mirror surface affects the position accuracy of the wafer stage in lithography ...
A metrology system for measuring aspheric test objects by subaperture stitching. A wavefront-measuri...
AbstractIn this work we examine how stitching interferometry can be used to provide both absolute ca...
The demand for customised optical devices is increasing tremendously. Such optical devices do not em...
In this thesis, the problem of the metrology of optical surfaces is examined. The need for accurate ...
Precision optics are a guarantor for production and quality control in many different sectors of hig...
Les synchrotrons utilisent une grande diversité de miroirs pour conditionner ou rediriger le faiscea...
Modern industries are stressed by the market for a crazy and continuous reduction of time-to-market ...
The measurement of parts of high geometrical complexity, such as those fabricated via additive manuf...
New, unconventional designs for modern optical systems strive for superior performance at lower cost...
In this paper, we describe the progress being made in the development of stitching interferometry fo...
Optical instruments are widely used for precision surface measurement. However, the dynamic range of...
Manufacturing has recently experienced increased adoption of optimised and fast solutions for checki...
Synchrotrons use a variety of mirrors for reshaping or redirecting X-ray beams. The mirrors can have...
New optical designs strive to achieve extreme performance, and continually increase the complexity o...
Nonflatness of stage mirror surface affects the position accuracy of the wafer stage in lithography ...
A metrology system for measuring aspheric test objects by subaperture stitching. A wavefront-measuri...