This paper provides an experimental microwave analysis of performance decrease of interdigitated HEMT's in millimeter wave range as the total gate width increases. The source inductance has been identified as the main reason of the power density decrease for large gate periphery devices. These behaviour has been checked by large signal measurements in Ka band
The extrinsic input and output capacitances of the field effect transistor small-signal equivalent c...
The article discusses dispersion in the dynamic characteristics of microwave HEMTs, and the applicat...
The aim of this article is to provide a clear-cut understanding of the origin of the current-gain pe...
This letter aims at investigating the impact of the gate width on the microwave field effect transis...
Parasitic component effects on the gain of GaAs FETs are described. Numerical simulation shows that ...
Some aspects of microwave transistor behavior are emerging as significant factors in applications in...
This work for the first time describes the results of hot electron stress experiments performed on I...
International audienceInAlN/AlN/GaN high electron mobility transistors (HEMT) show interesting perfo...
An introduction to the background, objectives and achievements of the project is given in chapter 1....
The InGaAs/InAlAs high electron mobility transistor (HEMT) offers the highest maximum frequency of o...
This work presents an experimental study of the low-frequency dispersion which impairs the performan...
Interdigital-gated AlGaAs/GaAs high electron mobility transistor (HEMT) structure was used to invest...
An AlGaN/GaN HEMT- and an InAlAs/InGaAs mHEMT technology, both with a gate-length of 100 nm, are inv...
This letter is aimed at discovering and analyzing anomalous phenomena affecting millimeter-wave FETs...
An AlGaN/GaN HEMT- and an InAlAs/InGaAs mHEMT technology, both with a gate-length of 100 nm, are inv...
The extrinsic input and output capacitances of the field effect transistor small-signal equivalent c...
The article discusses dispersion in the dynamic characteristics of microwave HEMTs, and the applicat...
The aim of this article is to provide a clear-cut understanding of the origin of the current-gain pe...
This letter aims at investigating the impact of the gate width on the microwave field effect transis...
Parasitic component effects on the gain of GaAs FETs are described. Numerical simulation shows that ...
Some aspects of microwave transistor behavior are emerging as significant factors in applications in...
This work for the first time describes the results of hot electron stress experiments performed on I...
International audienceInAlN/AlN/GaN high electron mobility transistors (HEMT) show interesting perfo...
An introduction to the background, objectives and achievements of the project is given in chapter 1....
The InGaAs/InAlAs high electron mobility transistor (HEMT) offers the highest maximum frequency of o...
This work presents an experimental study of the low-frequency dispersion which impairs the performan...
Interdigital-gated AlGaAs/GaAs high electron mobility transistor (HEMT) structure was used to invest...
An AlGaN/GaN HEMT- and an InAlAs/InGaAs mHEMT technology, both with a gate-length of 100 nm, are inv...
This letter is aimed at discovering and analyzing anomalous phenomena affecting millimeter-wave FETs...
An AlGaN/GaN HEMT- and an InAlAs/InGaAs mHEMT technology, both with a gate-length of 100 nm, are inv...
The extrinsic input and output capacitances of the field effect transistor small-signal equivalent c...
The article discusses dispersion in the dynamic characteristics of microwave HEMTs, and the applicat...
The aim of this article is to provide a clear-cut understanding of the origin of the current-gain pe...