have shown that the Raman and infrared techniques can identify components in films as thin as 200A and analyze the ent irety of films as thick as 1 micron. Acknowledgment This work was sponsored by the Office of Naval Research. Manuscript submitted Aug. 17, 1979; revised manu-script received Feb. 6, 1980. Any discussion of this paper wil l appear in a Dis-cussion Section to be published in the June 1981 JOURNAL. All discussions for the June 1981 Discussion Section should be submitted by Feb. 1, 1981. Publication costs of this article were assisted b
4. PERFORMING ORGANIZATION REPORT NUMBER(S) S. MONITORING ORGANIZATION REPORT NUMBER(S
The use of Raman and infrared spectroscopy to analyze surface films on metals is described. Surface ...
The productions of the thin metallic chalcogenide films are of particular interest for the wide rang...
$^{1}$B. Latimer and J. P. Devlin, Spectrochim. Acta 23A, 81 (1967).""Author Institution: Department...
The sensitivity of far-field Raman micro-spectroscopy was investigated to determine quantitatively t...
There is a fundamental need for techniques for thin film characterization. The current options for o...
This paper reports the use of Raman and infrared techniques for the qualitative and quantitative ana...
We demonstrate the possibility in quantifying the Raman intensities for both specimen and substrate ...
The intensity of the Raman signal from a thin-film multilayer varies nonmonotonically with the thick...
For the first time total internal reflection (TIR) Raman spectroscopy was utilized for thickness mea...
High-temperature superconductor films can be characterized using Raman spectroscopy to obtain the cr...
Raman spectroscopy is one of the most efficient and non-destructive techniques for characterizing ma...
Source: Masters Abstracts International, Volume: 40-07, page: . Thesis (M.Sc.)--University of Windso...
A new method of studying soap film flows is introduced and discussed from several viewpoints. Using ...
Author Institution: Spectroscopy Laboratory, Department of Physics, Illinois Institute of Technology...
4. PERFORMING ORGANIZATION REPORT NUMBER(S) S. MONITORING ORGANIZATION REPORT NUMBER(S
The use of Raman and infrared spectroscopy to analyze surface films on metals is described. Surface ...
The productions of the thin metallic chalcogenide films are of particular interest for the wide rang...
$^{1}$B. Latimer and J. P. Devlin, Spectrochim. Acta 23A, 81 (1967).""Author Institution: Department...
The sensitivity of far-field Raman micro-spectroscopy was investigated to determine quantitatively t...
There is a fundamental need for techniques for thin film characterization. The current options for o...
This paper reports the use of Raman and infrared techniques for the qualitative and quantitative ana...
We demonstrate the possibility in quantifying the Raman intensities for both specimen and substrate ...
The intensity of the Raman signal from a thin-film multilayer varies nonmonotonically with the thick...
For the first time total internal reflection (TIR) Raman spectroscopy was utilized for thickness mea...
High-temperature superconductor films can be characterized using Raman spectroscopy to obtain the cr...
Raman spectroscopy is one of the most efficient and non-destructive techniques for characterizing ma...
Source: Masters Abstracts International, Volume: 40-07, page: . Thesis (M.Sc.)--University of Windso...
A new method of studying soap film flows is introduced and discussed from several viewpoints. Using ...
Author Institution: Spectroscopy Laboratory, Department of Physics, Illinois Institute of Technology...
4. PERFORMING ORGANIZATION REPORT NUMBER(S) S. MONITORING ORGANIZATION REPORT NUMBER(S
The use of Raman and infrared spectroscopy to analyze surface films on metals is described. Surface ...
The productions of the thin metallic chalcogenide films are of particular interest for the wide rang...