High quality SiO2 thin films were grown by atomic layer deposition using a newly considered silicon precursor, SAM24, an aminosilane, with an ozone/oxygen mixture. SAM24 is a liquid and has sufficient volatility (with a vapor pressure of 2 Torr at R.T.) and is therefore easy to deliver into the reactor. Deposits obtained exhibit a very good thickness control when deposited as low as 100 ºC and up to 400 ºC at 1 Torr in a hot wall reactor
The availability of soft synthetic processes for the preparation of SiO2 films with tailored feature...
This study focuses on the atomic layer deposition (ALD) of high quality SiO2 thin films for optical ...
High structural quality silicon dioxide films have been prepared by the remote plasma-enhanced chemi...
In this paper, we report ALD deposition of silicon dioxide using either thermal or plasma enhanced a...
SiO2 is one of the most important dielectric materials that is widely used in the microelectronics i...
In this work, we report the successful growth of high-quality SiO2 films by low-temperature plasma-e...
In this work, we report the successful growth of high-quality SiO2 films by low-temperature plasma-e...
Silicon dioxide (SiO2) films are deposited by atomic layer deposition (ALD) at low temperatures from...
SiO2 is the most widely used dielectric material but its growth or deposition involves high thermal ...
Atomic layer deposition (ALD) was used to deposit SiO2 films in the temperature range of 50-400 oC. ...
High-quality silicon oxide (SiO2) thin films are deposited by plasma-enhanced atomic layer depositio...
In this work, an unusual silicon chemical vapor deposition precursor is used, which allows the safe ...
The impact of aminosilane precursor structure on silicon oxides by Atomic Layer Deposition (ALD) was...
Rapid atomic layer deposition (ALD) SiO2 thin film was deposited at various temperatures (below 250 ...
The deposition of high-quality SiO2 films has been achieved through the use of both plasma-enhanced ...
The availability of soft synthetic processes for the preparation of SiO2 films with tailored feature...
This study focuses on the atomic layer deposition (ALD) of high quality SiO2 thin films for optical ...
High structural quality silicon dioxide films have been prepared by the remote plasma-enhanced chemi...
In this paper, we report ALD deposition of silicon dioxide using either thermal or plasma enhanced a...
SiO2 is one of the most important dielectric materials that is widely used in the microelectronics i...
In this work, we report the successful growth of high-quality SiO2 films by low-temperature plasma-e...
In this work, we report the successful growth of high-quality SiO2 films by low-temperature plasma-e...
Silicon dioxide (SiO2) films are deposited by atomic layer deposition (ALD) at low temperatures from...
SiO2 is the most widely used dielectric material but its growth or deposition involves high thermal ...
Atomic layer deposition (ALD) was used to deposit SiO2 films in the temperature range of 50-400 oC. ...
High-quality silicon oxide (SiO2) thin films are deposited by plasma-enhanced atomic layer depositio...
In this work, an unusual silicon chemical vapor deposition precursor is used, which allows the safe ...
The impact of aminosilane precursor structure on silicon oxides by Atomic Layer Deposition (ALD) was...
Rapid atomic layer deposition (ALD) SiO2 thin film was deposited at various temperatures (below 250 ...
The deposition of high-quality SiO2 films has been achieved through the use of both plasma-enhanced ...
The availability of soft synthetic processes for the preparation of SiO2 films with tailored feature...
This study focuses on the atomic layer deposition (ALD) of high quality SiO2 thin films for optical ...
High structural quality silicon dioxide films have been prepared by the remote plasma-enhanced chemi...