The four major Hf precursors used by the industry are reviewed, compared and contrasted. The production of Hf-based chemicals proceeds through HfCl4, the first of the four major Hf precursors used by the industry, and the precursor to all Hf based materials. The synthesis of the other three major Hf precursors (TEMAH, TDEAH and Hf t-butoxide) starting from HfCl4 provides a rational model for the major impurities commonly found in these materials. Analysis of these impurities in Hf-based precursors is reviewed, including the influence that differing sample preparation methods can have on analytical results leading to apparently different analyses of the same chemical batch. Thermal stability of the Hf precursors is also reviewed. Using our k...
The volatility and thermal stability of a series of hafnium complexes with guanidinates and amidinat...
International audienceThe identification of appropriate ligand-metal combinations, which successfull...
We investigated nucleation and growth characteristics of atomic layer deposition (ALD) HfO2 on exfol...
Novel volatile compounds of hafnium, namely tetrakis-N,O-dialkylcarbamato hafnium(IV) [Hf(iPrNC(O)Oi...
The paper will introduce a simple new method on the synthesis of both hafnium and zirconium nitrate ...
Hafnium oxide films were deposited on Si(100) substrates using pulsed metal-organic chemical vapor d...
Graduation date:2017Aqueous hydroxo Hf nanoclusters enable studies to identify and codify steps in t...
In the early 2000-ies, world leaders in the field of computer engineering, such companies as IBM, In...
The HfO2 thin-film is a very promising gate dielectric material for last generation transistors. The...
High dielectric oxides namely ZrO<SUB>2</SUB> and HfO<SUB>2</SUB> have gained a lot of importance as...
Design and creation of new materials with unusual, predictable or predeterminated properties become ...
Atomic layer deposition of Hf-Si-O and Hf O2 using Hf Cl4, Si Cl4, and H2 O was studied. The growth ...
The hafnium and silicon precursors, Hf(NMe2)4 and ButMe2SiOH, have been investigated for the MOCVD o...
Thin films of HfO2 were grown by metal-organic chemical vapour deposition on fused quartz substrates...
We have found that a hafnia precursor (hafnium bis-isopropoxy bis-thd) for chemical solution deposit...
The volatility and thermal stability of a series of hafnium complexes with guanidinates and amidinat...
International audienceThe identification of appropriate ligand-metal combinations, which successfull...
We investigated nucleation and growth characteristics of atomic layer deposition (ALD) HfO2 on exfol...
Novel volatile compounds of hafnium, namely tetrakis-N,O-dialkylcarbamato hafnium(IV) [Hf(iPrNC(O)Oi...
The paper will introduce a simple new method on the synthesis of both hafnium and zirconium nitrate ...
Hafnium oxide films were deposited on Si(100) substrates using pulsed metal-organic chemical vapor d...
Graduation date:2017Aqueous hydroxo Hf nanoclusters enable studies to identify and codify steps in t...
In the early 2000-ies, world leaders in the field of computer engineering, such companies as IBM, In...
The HfO2 thin-film is a very promising gate dielectric material for last generation transistors. The...
High dielectric oxides namely ZrO<SUB>2</SUB> and HfO<SUB>2</SUB> have gained a lot of importance as...
Design and creation of new materials with unusual, predictable or predeterminated properties become ...
Atomic layer deposition of Hf-Si-O and Hf O2 using Hf Cl4, Si Cl4, and H2 O was studied. The growth ...
The hafnium and silicon precursors, Hf(NMe2)4 and ButMe2SiOH, have been investigated for the MOCVD o...
Thin films of HfO2 were grown by metal-organic chemical vapour deposition on fused quartz substrates...
We have found that a hafnia precursor (hafnium bis-isopropoxy bis-thd) for chemical solution deposit...
The volatility and thermal stability of a series of hafnium complexes with guanidinates and amidinat...
International audienceThe identification of appropriate ligand-metal combinations, which successfull...
We investigated nucleation and growth characteristics of atomic layer deposition (ALD) HfO2 on exfol...