Geometry scaling due to technology evolution as well as Vcc scaling lead to failures in large SRAM arrays such as caches. Faulty bits can be tolerated from the average performance perspective, but make critical real-time embedded systems non time-analyzable or worst-case execution time (WCET) estimations unacceptably large. This paper proposes a mechanism to tolerate faulty bits in caches while still providing safe and tight WCET. Our solution is based on adapting structures such as the victim cache, cache eviction buffers or miss state handle registers to serve as replacement for faulty cache stor-age. We show how modest modifications in the hard-ware help providing safe and tight WCET on the face of permanent faulty bits with negligible i...
Information integrity in cache memories is a fundamental requirement for dependable computing. Conve...
DoctorReliability of a memory subsystem is one of the most important feature to computer system stab...
Abstract—With increasing parameter variations in nanometer technologies, on-chip cache in processor ...
Geometry scaling due to technology evolution as well as Vcc scaling lead to failures in large SRAM a...
Transistors per area unit double in every new technology node. However, the electric field density a...
International audienceFine-grained disabling and reconfiguration of hardwareelements (functional uni...
As device density grows, each transistor gets smaller and more fragile leading to an overall higher ...
The traditional performance-cost benefits we have enjoyed for decades from technology scaling are ch...
Cache memories have been extensively used to bridge the gap between high speed processors and relati...
International audienceWith the progress of the technology, the presence of transient faults (e.g. bi...
Process parameter variations are expected to be significantly high in a sub-50-nm technology regime,...
Cache memory is a fundamental component of all modern microprocessors. Caches provide for efficient ...
Since array structures represent well over half the area and transistors on-chip, maintaining their ...
2012-01-31Benchmarking the FIT (failures in time of 1E9 hours) rates of caches due to soft errors is...
Aging of transistors can substantially shorten the lifetime of devices in sub-nanometric technologie...
Information integrity in cache memories is a fundamental requirement for dependable computing. Conve...
DoctorReliability of a memory subsystem is one of the most important feature to computer system stab...
Abstract—With increasing parameter variations in nanometer technologies, on-chip cache in processor ...
Geometry scaling due to technology evolution as well as Vcc scaling lead to failures in large SRAM a...
Transistors per area unit double in every new technology node. However, the electric field density a...
International audienceFine-grained disabling and reconfiguration of hardwareelements (functional uni...
As device density grows, each transistor gets smaller and more fragile leading to an overall higher ...
The traditional performance-cost benefits we have enjoyed for decades from technology scaling are ch...
Cache memories have been extensively used to bridge the gap between high speed processors and relati...
International audienceWith the progress of the technology, the presence of transient faults (e.g. bi...
Process parameter variations are expected to be significantly high in a sub-50-nm technology regime,...
Cache memory is a fundamental component of all modern microprocessors. Caches provide for efficient ...
Since array structures represent well over half the area and transistors on-chip, maintaining their ...
2012-01-31Benchmarking the FIT (failures in time of 1E9 hours) rates of caches due to soft errors is...
Aging of transistors can substantially shorten the lifetime of devices in sub-nanometric technologie...
Information integrity in cache memories is a fundamental requirement for dependable computing. Conve...
DoctorReliability of a memory subsystem is one of the most important feature to computer system stab...
Abstract—With increasing parameter variations in nanometer technologies, on-chip cache in processor ...