Microwave annealing of ion-implanted layers in semiconductors is an emerging application of thermal processing of semiconductors, with low processing temperature eliminating unwanted diffusion as the main potential advantage. In this work, requirements and limitations of the microwave processing chamber are discussed first, and secondly, for the first time, results from a processed manufacturing lot using microwave annealing are discussed. The achieved results show that is feasible to achieve the same level of activation of implanted layers as in conventional high temperature RTP processing using the microwave at temperatures below 400 oC, and equivalent processing time
Microwave heating is used to initiate the ion-cut process for transfer of coherent silicon-layers on...
Effects of low-temperature (≈500◦C) microwave annealing (MWA) of Cluster-Carbon (C7) and Phosphorus ...
A major area of research for integrated electronic systems is the development of systems on glass or...
Abstract — Microwave annealing (MWA) and rapid thermal annealing (RTA) of dopants in implanted Si ar...
Compared with conventional silicon-based semiconductors, amorphous oxide semiconductors present seve...
Thin aluminum oxide layers deposited on silicon by thermal atomic layer deposition can be used to re...
A new method for annealing semiconductors using pulsed microwave power is presented. It has a very g...
abstract: This research emphasizes the use of low energy and low temperature post processing to impr...
A key requirement for future integrated circuit fabrication is lower processing temperatures at all ...
This paper describes the regrowth and activation characteristics of Si-implanted GaAs resulting from...
Résumé. 2014 Une nouvelle méthode de recuit pulsé de semiconducteurs par énergie microonde est propo...
In this letter, rapid thermal annealing (RTA) and microwave annealing (MA) are compared to demonstra...
As the miniaturization of the size of semiconductor components, the silicon-based transistor has rea...
In this paper, we demonstrated the shallow NiSiGe Schottky junction on the SiGe P-channel by using ...
Microwave heating is used to initiate the ion-cut process for transfer of coherent silicon-layers on...
Microwave heating is used to initiate the ion-cut process for transfer of coherent silicon-layers on...
Effects of low-temperature (≈500◦C) microwave annealing (MWA) of Cluster-Carbon (C7) and Phosphorus ...
A major area of research for integrated electronic systems is the development of systems on glass or...
Abstract — Microwave annealing (MWA) and rapid thermal annealing (RTA) of dopants in implanted Si ar...
Compared with conventional silicon-based semiconductors, amorphous oxide semiconductors present seve...
Thin aluminum oxide layers deposited on silicon by thermal atomic layer deposition can be used to re...
A new method for annealing semiconductors using pulsed microwave power is presented. It has a very g...
abstract: This research emphasizes the use of low energy and low temperature post processing to impr...
A key requirement for future integrated circuit fabrication is lower processing temperatures at all ...
This paper describes the regrowth and activation characteristics of Si-implanted GaAs resulting from...
Résumé. 2014 Une nouvelle méthode de recuit pulsé de semiconducteurs par énergie microonde est propo...
In this letter, rapid thermal annealing (RTA) and microwave annealing (MA) are compared to demonstra...
As the miniaturization of the size of semiconductor components, the silicon-based transistor has rea...
In this paper, we demonstrated the shallow NiSiGe Schottky junction on the SiGe P-channel by using ...
Microwave heating is used to initiate the ion-cut process for transfer of coherent silicon-layers on...
Microwave heating is used to initiate the ion-cut process for transfer of coherent silicon-layers on...
Effects of low-temperature (≈500◦C) microwave annealing (MWA) of Cluster-Carbon (C7) and Phosphorus ...
A major area of research for integrated electronic systems is the development of systems on glass or...