Add to ORKGA novel x-ray diffractometer has been used to characterize the texture of 2 km of textured tape in segments up to 20 m long. Techniques have been developed for the study of the uniformity of texture and for the detection of second phases, deviations from cube texture, and the sharpness of cube texture, in metal substrates, oxide buffer layers, and YBa2Cu3O7 (YBCO) superconductors
The introduction of synchrotron beamlines for high-energy X-ray diffraction raises new possibilities...
International audienceIt is shown that high-energy X-ray diffraction allows a fast and accurate text...
Most of all solid materials are polycrystalline, often also polyphase. They consists of very many, s...
A novel x-ray diffractometer has been used to characterize the texture of 2 km of textured tape in s...
A novel x-ray diffractometer has been used to characterize the texture of 2 km of textured tape in s...
A fast and accurate method has been developed for measuring crystalline texture in homogeneous mater...
A fast and accurate method that uses a conventional powder x-ray diffractometer has been developed f...
An X-ray energy-dispersive diffraction technique to study the texture of materials using synchrotron...
Polycrystalline copper thin films used in semiconductor applications have been shown to have longer ...
Co-financement BDI CNRS-Alcatel-Alsthom-Recherche (Marcoussis)this work deals with crystallographic ...
This Phase I project was undertaken to assess the feasibility of implementing a particular diagnosti...
Energy-dispersive X-ray diffraction using synchrotron radiation has a number of advantages for deter...
Metallic tubes usually show heterogeneities along circumference and through wall thickness. Local te...
A method for the quantitative characterization of texture in thin films using x-ray diffraction is p...
The introduction of synchrotron beamlines for high-energy X-ray diffraction raises new possibilities...
The introduction of synchrotron beamlines for high-energy X-ray diffraction raises new possibilities...
International audienceIt is shown that high-energy X-ray diffraction allows a fast and accurate text...
Most of all solid materials are polycrystalline, often also polyphase. They consists of very many, s...
A novel x-ray diffractometer has been used to characterize the texture of 2 km of textured tape in s...
A novel x-ray diffractometer has been used to characterize the texture of 2 km of textured tape in s...
A fast and accurate method has been developed for measuring crystalline texture in homogeneous mater...
A fast and accurate method that uses a conventional powder x-ray diffractometer has been developed f...
An X-ray energy-dispersive diffraction technique to study the texture of materials using synchrotron...
Polycrystalline copper thin films used in semiconductor applications have been shown to have longer ...
Co-financement BDI CNRS-Alcatel-Alsthom-Recherche (Marcoussis)this work deals with crystallographic ...
This Phase I project was undertaken to assess the feasibility of implementing a particular diagnosti...
Energy-dispersive X-ray diffraction using synchrotron radiation has a number of advantages for deter...
Metallic tubes usually show heterogeneities along circumference and through wall thickness. Local te...
A method for the quantitative characterization of texture in thin films using x-ray diffraction is p...
The introduction of synchrotron beamlines for high-energy X-ray diffraction raises new possibilities...
The introduction of synchrotron beamlines for high-energy X-ray diffraction raises new possibilities...
International audienceIt is shown that high-energy X-ray diffraction allows a fast and accurate text...
Most of all solid materials are polycrystalline, often also polyphase. They consists of very many, s...