LIBRARIES Non-destructive Electron Microscopy through Interaction-free Quantum Measurement

In this thesis, the possibility of interaction-free quantum measurements with elec-trons is investigated. With a scheme based on existing charged particle trapping techniques, it is demonstrated that such interaction-free measurements are possible in the presence of previously measured quantum decoherence rates, and the efficiency of the measurement scheme and the absorption probability are estimated. Use of such interaction-free measurements with electrons in imaging applications could dra-matically reduce sample damage induced by electron-exposure, which might allow non-destructive, molecular-resolution electron microscopy