Add to ORKGExperimental results for a new method of measuring the minority carrier lifetime as a process control tool to determine trace metal contamination following wafering and epitaxial growth of silicon in a production environment are reported. In this new method the minority carrier lifetime is measured by microwave photo-conductive decay (µ-PCD) while charging the surface silicon oxide with a corona charge. We have named the method Charge-PCD. Results are given comparing various qualities of the surface oxides prepared by low temperature methods coupled with various corona charging recipes in order to determine the optimum process and limitations of the new method
The Quasi-Optical Photoconductivity Decay (QO-PCD) technique is developed by UNIST for precise measu...
This master thesis covers generation and recombination of minority charge carriers in (multi-) cryst...
The buried contact solar cell is produced in industry using monocrystalline silicon. The low shading...
Experimental results for a new method of measuring the minority carrier lifetime as a process contro...
We attempted to measure the bulk carrier recombination lifetime of Si wafers by the microwave reflec...
Measurements of effective lifetimes on epitaxial silicon thin-film material have been carried out. T...
Accurate measurements of the injection-dependent excess carrier lifetime of silicon samples are esse...
The development of crystalline silicon thin films (cSiTF) for several solar cell concepts is pursued...
It is well known that gettering and passivation steps during solar cell processing enhance the minor...
The main material parameter of silicon is the minority carrier bulk lifetime and influences the effe...
AbstractIn this work the temperature of a silicon sample excited by a laser during a time dependent ...
Recombination lifetime and diffusion length measured with the photoconductance d cay and surface pho...
The interpretation of minority carrier Iifetime measurements on oxidized wafers is often difficult. ...
In this contribution the minority carrier lifetime in the electrically active epitaxial layer of cry...
Abstract—The measurement of dark Dσ, gamma-in-duced γσ conductivities and the expected conductivity ...
The Quasi-Optical Photoconductivity Decay (QO-PCD) technique is developed by UNIST for precise measu...
This master thesis covers generation and recombination of minority charge carriers in (multi-) cryst...
The buried contact solar cell is produced in industry using monocrystalline silicon. The low shading...
Experimental results for a new method of measuring the minority carrier lifetime as a process contro...
We attempted to measure the bulk carrier recombination lifetime of Si wafers by the microwave reflec...
Measurements of effective lifetimes on epitaxial silicon thin-film material have been carried out. T...
Accurate measurements of the injection-dependent excess carrier lifetime of silicon samples are esse...
The development of crystalline silicon thin films (cSiTF) for several solar cell concepts is pursued...
It is well known that gettering and passivation steps during solar cell processing enhance the minor...
The main material parameter of silicon is the minority carrier bulk lifetime and influences the effe...
AbstractIn this work the temperature of a silicon sample excited by a laser during a time dependent ...
Recombination lifetime and diffusion length measured with the photoconductance d cay and surface pho...
The interpretation of minority carrier Iifetime measurements on oxidized wafers is often difficult. ...
In this contribution the minority carrier lifetime in the electrically active epitaxial layer of cry...
Abstract—The measurement of dark Dσ, gamma-in-duced γσ conductivities and the expected conductivity ...
The Quasi-Optical Photoconductivity Decay (QO-PCD) technique is developed by UNIST for precise measu...
This master thesis covers generation and recombination of minority charge carriers in (multi-) cryst...
The buried contact solar cell is produced in industry using monocrystalline silicon. The low shading...