This paper presents a first-order analytical model for determining the performance degradation caused by permanently faulty cells in archi-tectural and non-architectural arrays. We refer to this degradation as the performance vulnerability factor (PVF). The study assumes a future where cache blocks with faulty cells are disabled resulting in less cache capacity and extra misses while faulty predictor cells are still used but cause additional mispredictions. For a given program run, random probability of permanent cell failure, and processor configuration, the model can rapidly provide the expected PVF as well as lower and upper PVF probability distri-bution bounds for an individual array or array combination. The model is used to predict th...
Aggressive technology scaling is increasing the impact of soft errors on microprocessor reliability....
With shrinking process technology, the primary cause of transient faults in semiconductors shifts aw...
Improving energy efficiency is critical to increasing computing capability, from mobile devices oper...
The traditional performance-cost benefits we have enjoyed for decades from technology scaling are ch...
Soft error reliability has become a first-order design criterion for modern microprocessors. Archite...
Abstract—Continuous circuit and wire miniaturization in-creasingly exert more pressure on the comput...
Continuous circuit and wire miniaturization increasingly exert more pressure on the computer designe...
Reliability to soft errors is a significant design challenge in modern microprocessors owing to an e...
2012-01-31Benchmarking the FIT (failures in time of 1E9 hours) rates of caches due to soft errors is...
Single-event upsets from particle strikes have become a key challenge in microprocessor design. Tech...
Continuous circuit miniaturization and increased pro-cess variability point to a future with diminis...
Abstract—Soft Errors have emerged as a key challenge to microprocessor design. Traditional soft erro...
Near-Threshold Computing embodies an intriguing choice for mobile processors due to the promise of s...
Abstract—Reliability is an important design constraint in modern microprocessors, and one of the fun...
To face future reliability challenges, it is necessary to quantify the risk of error in any part of ...
Aggressive technology scaling is increasing the impact of soft errors on microprocessor reliability....
With shrinking process technology, the primary cause of transient faults in semiconductors shifts aw...
Improving energy efficiency is critical to increasing computing capability, from mobile devices oper...
The traditional performance-cost benefits we have enjoyed for decades from technology scaling are ch...
Soft error reliability has become a first-order design criterion for modern microprocessors. Archite...
Abstract—Continuous circuit and wire miniaturization in-creasingly exert more pressure on the comput...
Continuous circuit and wire miniaturization increasingly exert more pressure on the computer designe...
Reliability to soft errors is a significant design challenge in modern microprocessors owing to an e...
2012-01-31Benchmarking the FIT (failures in time of 1E9 hours) rates of caches due to soft errors is...
Single-event upsets from particle strikes have become a key challenge in microprocessor design. Tech...
Continuous circuit miniaturization and increased pro-cess variability point to a future with diminis...
Abstract—Soft Errors have emerged as a key challenge to microprocessor design. Traditional soft erro...
Near-Threshold Computing embodies an intriguing choice for mobile processors due to the promise of s...
Abstract—Reliability is an important design constraint in modern microprocessors, and one of the fun...
To face future reliability challenges, it is necessary to quantify the risk of error in any part of ...
Aggressive technology scaling is increasing the impact of soft errors on microprocessor reliability....
With shrinking process technology, the primary cause of transient faults in semiconductors shifts aw...
Improving energy efficiency is critical to increasing computing capability, from mobile devices oper...