Abstract: PANI films were deposited on glass substrates by in-situ polymerization and characterized by UV-VIS spectroscopy and atomic force microscopy. A method is developed to accurately analyze ellipsometric data obtained for transparent glass substrates before and after modification with absorbing polymer films. Surface modification was made with an overlayer such as polyaniline (PANI), which exhibits different optical properties by varying its oxidation state. First, the issue of using transparent substrates for ellipsometry studies was examined and then, spectroscopic ellipsometry was used to characterize absorbing overlayers on transparent glasses. The same methodologies of data analysis can be also applied to other absorbing films on...
The properties of a thin polymer film can be significantly affected by the presence of a penetrant. ...
Thin organic films are used in a wide variety of applications, from membranes to microelectronics. W...
International audienceThe present work concerns the use of spectroscopic ellipsometry to study the e...
PANI films were deposited on glass substrates by in-situ polymerization and characterized by UV-VIS ...
PANI films were deposited on glass substrates by in-situ polymerization and characterized by UV-VIS ...
PANI films were deposited on glass substrates by in-situ polymerization and characterized by UV-VIS ...
PANI films were deposited on glass substrates by in-situ polymerization and characterized by UV-VIS...
PANI films were deposited on glass substrates by in-situ polymerization and characterized by UV-VIS ...
PANI films were deposited on glass substrates by in-situ polymerization and characterized by UV-VIS ...
Amongst the most common thin film characterization tools, spectroscopic ellipsometry (SE) is increas...
Amongst the most common thin film characterization tools, spectroscopic ellipsometry (SE) is increas...
A new and simple method is proposed to analyze the profiles of glass surface layers based on their r...
Polyaniline films potentiodynamically synthesised on gold substrates are analysed ex situ by convent...
This paper describes the use of ellipsometry as a precise and accurate technique for characterizing ...
The properties of a thin polymer film can be significantly affected by the presence of a penetrant. ...
The properties of a thin polymer film can be significantly affected by the presence of a penetrant. ...
Thin organic films are used in a wide variety of applications, from membranes to microelectronics. W...
International audienceThe present work concerns the use of spectroscopic ellipsometry to study the e...
PANI films were deposited on glass substrates by in-situ polymerization and characterized by UV-VIS ...
PANI films were deposited on glass substrates by in-situ polymerization and characterized by UV-VIS ...
PANI films were deposited on glass substrates by in-situ polymerization and characterized by UV-VIS ...
PANI films were deposited on glass substrates by in-situ polymerization and characterized by UV-VIS...
PANI films were deposited on glass substrates by in-situ polymerization and characterized by UV-VIS ...
PANI films were deposited on glass substrates by in-situ polymerization and characterized by UV-VIS ...
Amongst the most common thin film characterization tools, spectroscopic ellipsometry (SE) is increas...
Amongst the most common thin film characterization tools, spectroscopic ellipsometry (SE) is increas...
A new and simple method is proposed to analyze the profiles of glass surface layers based on their r...
Polyaniline films potentiodynamically synthesised on gold substrates are analysed ex situ by convent...
This paper describes the use of ellipsometry as a precise and accurate technique for characterizing ...
The properties of a thin polymer film can be significantly affected by the presence of a penetrant. ...
The properties of a thin polymer film can be significantly affected by the presence of a penetrant. ...
Thin organic films are used in a wide variety of applications, from membranes to microelectronics. W...
International audienceThe present work concerns the use of spectroscopic ellipsometry to study the e...