We propose a phase field model for stress and diffusion induced interface motion. This model in particular can be used to describe diffusion induced grain boundary motion (DIGM) and generalizes a model of Cahn, Fife and Penrose as it more accurately incorporates stress effects. In this paper we will demonstrate that the model can also be used to describe other stress driven interface motion. As an example interface motion resulting from interactions of interfaces with dislocations is studied.
Abstract. The stress-driven grain boundary diffusion problem is a continuum model of mass transport ...
The relaxation of stress in a thin film due to grain boundary diffusion is investigated in terms of ...
[[abstract]]Based on Whipple-Suzuoka solutions, the chemical stresses induced by grain-boundary diff...
We propose a phase field model for stress and diffusion-induced interface motion. This model, in par...
The Phase field method has been used to study Diffusion Induced Grain boundary Migration (DIGM) in b...
A new approach is proposed for the description of diffusion-induced grain boundary migration (DIGM)....
A recently developed phase-field model for simulating diffusion-induced grain boundary migration (DI...
A recently developed phase-field model for simulating diffusion-induced grain boundary migration (DI...
A two-dimensional continuum model is developed for stress relaxation in thin films through grain bou...
Abstract. The stress-driven grain boundary diffusion problem is a continuum model of mass transport ...
This talk is based on a recent work by Prof. H.-D. Alber and myself, and concerned with a phase fiel...
With reduction in size, ever greater operational demands are placed on electronics components at all...
A 2D FEM approach for studying dislocation-phase boundary interaction is proposed. By adopting the c...
We propose a multi-order parameter phase field system and a sharp interface model to describe bidire...
The relaxation of stress in a thin film due to grain boundary diffusion is investigated in terms of ...
Abstract. The stress-driven grain boundary diffusion problem is a continuum model of mass transport ...
The relaxation of stress in a thin film due to grain boundary diffusion is investigated in terms of ...
[[abstract]]Based on Whipple-Suzuoka solutions, the chemical stresses induced by grain-boundary diff...
We propose a phase field model for stress and diffusion-induced interface motion. This model, in par...
The Phase field method has been used to study Diffusion Induced Grain boundary Migration (DIGM) in b...
A new approach is proposed for the description of diffusion-induced grain boundary migration (DIGM)....
A recently developed phase-field model for simulating diffusion-induced grain boundary migration (DI...
A recently developed phase-field model for simulating diffusion-induced grain boundary migration (DI...
A two-dimensional continuum model is developed for stress relaxation in thin films through grain bou...
Abstract. The stress-driven grain boundary diffusion problem is a continuum model of mass transport ...
This talk is based on a recent work by Prof. H.-D. Alber and myself, and concerned with a phase fiel...
With reduction in size, ever greater operational demands are placed on electronics components at all...
A 2D FEM approach for studying dislocation-phase boundary interaction is proposed. By adopting the c...
We propose a multi-order parameter phase field system and a sharp interface model to describe bidire...
The relaxation of stress in a thin film due to grain boundary diffusion is investigated in terms of ...
Abstract. The stress-driven grain boundary diffusion problem is a continuum model of mass transport ...
The relaxation of stress in a thin film due to grain boundary diffusion is investigated in terms of ...
[[abstract]]Based on Whipple-Suzuoka solutions, the chemical stresses induced by grain-boundary diff...