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We consider the product design problem of allocating the chip sites on a semiconduc-tor wafer to various types of chips. The manufacturing facility sells chips to its customers in sets (a specified number of several different types of chips), and the objective of the facility is to maximize the average production rate of sets. Variabilitj ' in the wafer fab-rication process, in particular random yield, poses a major obstacle in producing sets in a reliable fashion. A stochastic analysis is employed to develop an effective wafer de-sign, and to measure the improvement in performance of the multi-type wafer over the traditional single-type wcifer. The analysis reveals that multi-type wafers regularize the production flow of non-defective chips of each type and cause these flows to be positively correlated, both of which help to improve performance. A numerical example is provided that illustrates the analysis and demonstrates the design's effectiveness